1. In-depth resolution for LBIC technique by two-photon absorption

   • D. Wan
   • V. Pouget
   • P. Fouillat

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 371 - 375

2. Structural peculiarities of 4H-SiC irradiated by Bi ions

   • E. V. Kalinina
   • V. A. Skuratov
   • M. P. Shcheglov

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 376 - 380

3. Si and Ge nanocluster formation in silica matrix

   • Roushdey Salh
   • L. Fitting
   • H. -J. Fitting

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 381 - 386

4. Cathodoluminescence and TEM studies of HVPE GaN layers grown on porous SiC substrates

   • E. Kolesnikova
   • M. Mynbaeva
   • A. Sitnikova

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 387 - 390

5. Cathodoluminescence investigation of silicon nanowires fabricated by thermal evaporation of SiO

   • G. Jia
   • T. Arguirov
   • J. Sha

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 391 - 394

6. IBIC characterization of charge transport in CdTe:Cl

   • P. J. Sellin
   • A. W. Davies
   • M. Veale

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 395 - 401

7. EBIC characterization of strained Si/SiGe heterostructures

   • E. B. Yakimov
   • R. H. Zhang
   • M. Seacrist

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 402 - 406

8. Simulation and measurements of EBIC images of photoconductive elements based on HgCdTe

   • V. V. Krapukhin
   • P. S. Vergeles
   • E. B. Yakimov

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 407 - 410

9. EBIC measurements of small diffusion length in semiconductor structures

   • E. B. Yakimov
   • S. S. Borisov
   • S. I. Zaitsev

   The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 411 - 413

10. Photoinduced transient spectroscopy of defect centers in GaN and SiC

    • P. Kamiński
    • R. Kozłowski
    • M. Pawłowski

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 414 - 420

11. Micro-and nano-structures in silicon studied by DLTS and scanning probe methods

    • D. Cavalcoli
    • A. Cavallini
    • S. Pizzini

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 421 - 426

12. The use of cathodoluminescence for the development of durable self-glowing crystals based on solid solutions YPO₄-EuPO₄

    • B. E. Burakov
    • V. M. Garbuzov
    • M. P. Orlova

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 427 - 430

13. STM and LEED studies of atomically ordered terraced Si(557) surfaces

    • A. N. Chaika
    • S. I. Bozhko
    • N. V. Abrosimov

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 431 - 435

14. Photoluminescence study on defects in multicrystalline silicon

    • T. Arguirov
    • W. Seifer
    • M. Kittler

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 436 - 439

15. Material-induced shunts in multicrystalline silicon solar cells

    • O. Breitenstein
    • J. Bauer
    • J. P. Rakotoniaina

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 440 - 443

16. Mathematical simulation of the distribution of minority charge carriers generated in a multilayer semiconducting structure by a wide electron beam

    • I. V. Burylova
    • V. I. Petrov
    • M. A. Stepovich

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 444 - 447

17. Initial stages of gold adsorption on silicon stepped surface at elevated temperatures

    • S. S. Kosolobov
    • Se Ahn Song
    • A. V. Latyshev

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 448 - 452

18. Multimodal luminescence spectra of ion-implanted silica

    • H. -J. Fitting
    • Roushdey Salh
    • B. Schmidt

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 453 - 457

19. Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding

    • X. Yu
    • O. Vyvenko
    • M. Reiche

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 458 - 461

20. Cathodoluminescence study of silicon oxide-silicon interface

    • M. V. Zamoryanskaya
    • V. I. Sokolov

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 462 - 468

21. AFM investigation of thin post-baked photoresistive films for microsystem technology application

    • S. E. Alexandrov
    • A. B. Speshilova
    • O. I. Ermeychik

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 469 - 472

22. Cathodoluminescence characteristics of pseudomorphic modulation-doped quantum well AlGaAs/InGaAs/AlGaAs heterostructures at high carrier densities and their radiation damaging

    • V. S. Khrustalev
    • A. V. Bobyl
    • M. V. Zamoryanskaya

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 473 - 477

23. Cathodoluminescence of laser A^IIB^VI heterostructures

    • A. S. Ivanov
    • V. I. Vasilev
    • M. V. Zamoryanskaya

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 478 - 481

24. Evolution of luminescence properties of natural oxide on silicon and porous silicon

    • R. V. Sokolov
    • M. V. Zamoryanskaya
    • V. I. Sokolov

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 482 - 486

25. Diagnostics of films and layers of nanometer thickness using middle energy ion scattering technique

    • V. V. Afrosimov
    • R. N. Il’in
    • I. T. Serenkov

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 487 - 490

26. EBIC characterization of light-emitting structures based on GaN

    • N. M. Shmidt
    • P. S. Vergeles
    • E. B. Yakimov

    The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia Pages: 491 - 494