High-temperature resistant materials and structural ceramics for use in high-temperature reactor and fusion reactor plants-requirements for modern physico-chemical analysis Hubertus Nickel OriginalPaper Pages: 5 - 47
High temperature corrosion behaviour of M(Co, Ni)CrAIY-coatings on high temperature materials-microanalytical investigations Volker ThienWolfgang Voss OriginalPaper Pages: 49 - 70
Microprobe analysis of reaction products of titanium and niobium with tungsten Ulrich ZwickerJürgen BremeKarl Nigge OriginalPaper Pages: 71 - 83
Depth profiling in surface regions of oxidized metal alloys by low energy PIXE V. DrükeR. HeckerD. Stöver OriginalPaper Pages: 85 - 91
Analytical electron microscopy of materials Johannes HeydenreichWolfgang Rechner OriginalPaper Pages: 93 - 113
Metallurgical factors determining the coercivity of ND-FE-B magnets Josef FidlerPeter Skalicky OriginalPaper Pages: 115 - 124
Application of EELS to the microanalysis of materials Ferdinand HoferPeter Warbichler OriginalPaper Pages: 125 - 134
Further development of microarea analysis techniques for determining nitrogen in steels Siegfried BaumgartlAchim Rüdiger BüchnerHermann Vetters OriginalPaper Pages: 135 - 137
Further development of microarea analysis techniques for determining nitrogen in steels Siegfried Baumgartl OriginalPaper Pages: 137 - 140
Further development of microarea analysis techniques for determining nitrogen in steels Siegfried BaumgartlAchim Rüdiger BüchnerHermann Vetters OriginalPaper Pages: 140 - 141
Further development of microarea analysis techniques for determining nitrogen in steels Achim R. Büchner OriginalPaper Pages: 142 - 143
Further development of microarea analysis techniques for determining nitrogen in steels Hans Joachim DudekHarald Hantsche OriginalPaper Pages: 143 - 145
Further development of microarea analysis techniques for determining nitrogen in steels Harald HantscheHans Joachim Dudek OriginalPaper Pages: 145 - 147
Further development of microarea analysis techniques for determining nitrogen in steels Daniel SchalkoordWerner RehbachPaul Schwaab OriginalPaper Pages: 148 - 149
Synergetic effects during sputter-assisted depth profiling: Growth-dominated topography development on InP and a model of the atomic mechanism Werner H. GriesKlaus Miethe OriginalPaper Pages: 169 - 177
Surface analysis of a glass leached with stable isotopes G. H. FrischatTh. RichterS. Scherrer OriginalPaper Pages: 179 - 192
Quantitative trace analysis with X-ray fluorescence in the scanning electron microscope Richard Eckert OriginalPaper Pages: 193 - 200
The analysis of carbide and intermetallic phase γ′ isolates in nickel alloys by means of injection method of flame atomic absorption spectrometry Andrzej Wyciślik OriginalPaper Pages: 201 - 209
Investigations in the ternary system Ti-Mo-N by means of EPMA and XRD Walter LengauerHans-Jürgen UllrichPeter Ettmayer OriginalPaper Pages: 211 - 218
A decoration technique for defect analysis in ceramics O. BureschF. E. BureschH. G. v. Schnering OriginalPaper Pages: 219 - 224
Electron microprobe analysis of micro amount powder samples: A case study on high purity coal Kaspar HoneggerWilfried Wintsch OriginalPaper Pages: 225 - 232
High performance analytical characterization of refractory metals Hugo M. OrtnerWilhelm BlödornGerold Wünsch OriginalPaper Pages: 233 - 260
Multi-element trace analysis of tungsten Volker SchererDieter Hirschfeld OriginalPaper Pages: 261 - 268
Characterization of high purity gallium Gerhard KudermannKarl-Heinz Blaufuß OriginalPaper Pages: 269 - 274
Glow discharge mass spectrometry-a powerful technique for the elemental analysis of solids Neil E. SandersonEdward HallDavid Hall OriginalPaper Pages: 275 - 290
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS Manfred Grasserbauer OriginalPaper Pages: 291 - 295
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS Peter M. Charalambous OriginalPaper Pages: 295 - 302
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS Norbert JakubowskiDietmar StuewerWojciech Vieth OriginalPaper Pages: 302 - 308
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS Horst E. Beske OriginalPaper Pages: 309 - 313
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS Alois ViragGernot Friedbacher OriginalPaper Pages: 313 - 319
High resolution auger electron spectroscopy for materials characterization Siegfried Hofmann OriginalPaper Pages: 321 - 345
Simultaneous SIMS/AES Measurements for the Characterization of Multilayer Systems K. MaßeliJ. BurbachL. Niewöhner OriginalPaper Pages: 347 - 353
Investigations on hopeite- and phosphophyllite-containing phosphate coatings on steel H. BubertH. PulmH. Puderbach OriginalPaper Pages: 355 - 364
XPS and SIMS investigations on plasma-treated glass surfaces J. BartellaH. GrünwaldU. Herwig OriginalPaper Pages: 365 - 369
SDS 800 — The new data system for quantitative depth profiling of inhomogeneous samples by SIMS Stefan M. DaiserHolger FrenzelChristian Scholze OriginalPaper Pages: 371 - 377
The detection of oxygen in magneto-optical layers with SIMS Hans J. TolleHeinrich Heitmann OriginalPaper Pages: 379 - 385
SIMS yields from glasses; secondary ion energy dependence and mass fractionation E. Urban EngströmAlexander LoddingUlf Södervall OriginalPaper Pages: 387 - 400
Characterization of nitrided and nitrocarburized surface compound layers of machine parts with AES Jože PiršAnton Zalar OriginalPaper Pages: 401 - 408
Investigation on the corrosion of brazed joints by means of scanning auger microprobe Holger JenettWaltraud BrandiHans-Dieter Steffens OriginalPaper Pages: 409 - 427
AES investigations of fracture surfaces of aluminium doped sintered molybdenum rods C. Setti OriginalPaper Pages: 437 - 444
Applications of synchrotron radiation in materials analysis Bruno Lengeler OriginalPaper Pages: 455 - 475
Distribution analysis of trace elements in low alloy steel by means of EPMA, SIMS, and TEM Peter WilhartitzWilfried WintschManfred Grasserbauer OriginalPaper Pages: 477 - 488
Application of work function measurements to the characterization of thin films and solid surfaces Gerd BachmannJörg ScholtesHans Oechsner OriginalPaper Pages: 489 - 496
SNMS-analysis of insulators Jan Fritz GeigerMichael KopnarskiHubert Paulus OriginalPaper Pages: 497 - 506