Abstract
Investigations carried out in order to determine traces of 25 elements in tungsten in the lower μg/g range are reported on. Atomic absorption spectrometry and plasma atomic emission spectrometry as well as solution photometry and activation analysis were the main techniques used.
Similar content being viewed by others
References
H. Mayer, E. Lassner, M. Schreiner, B. Lux, inProceedings of 10th Plansee Seminar 1981, Vol. 2, H. M. Ortner, Reutte, 1981, pp. 55–79.
H. M. Ortner, inSondermetalle, Verlag Chemie, Weinheim, 1983, pp. 79–102.
H. M. Ortner, in:Analysis of High Temperature Materials, Van der Biest, London-New York, 1983.
V. Scherer, D. Hirschfeld,Erzmetall 1986,39, 251.
R. Ullmann, H. Ringer,Fresenius' Z. Anal. Chem. 1986,323, 139.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Scherer, V., Hirschfeld, D. Multi-element trace analysis of tungsten. Mikrochim Acta 91, 261–268 (1987). https://doi.org/10.1007/BF01199501
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01199501