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Distribution analysis of trace elements in low alloy steel by means of EPMA, SIMS, and TEM

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Abstract

A combination of chemical analysis, EPMA, SIMS, and TEM was applied to gain information on the bulk values, the microstructure and the microdistribution of contaminants. The limitations of classical chemical analysis were overcome by the application of highly sophisticated analytical techniques. Optimized measurement conditions were worked out for SIMS analysis and basic data such as relative sensitivity factors were gained for further investigations. A correlation between the microdistribution of contaminants and mechanical data could not be established so far, since only two samples were investigated.

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Abbreviations

BAS:

British Association of Standardisation (UK)

CGHE:

carrier gas hot extraction

DL:

detection limit

ED:

energy discrimination

EPMA:

electron probe micro analysis

E 0 :

energy of primary ions

HMR:

high mass resolution

I B :

primary ion beam current

NBS:

National Bureau of Standards (USA)

OES:

optical emission spectroscopy

PI:

primary ions

RSF:

relative sensitivity factor

SI:

secondary ions

SIMS:

secondary ion mass spectrometry

SKF:

SKF Analytica Taeby (Sweden)

TEM:

transmission electron microscopy

XRFA:

X-ray fluorescence analysis

d A :

diameter of analyzed area

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Authors and Affiliations

  1. Metallwerk Plansee GmbH, A-6600, Reutte/Tirol, Austria

    Peter Wilhartitz

  2. Gebrüder Sulzer AG, CH-8401, Winterthur, Switzerland

    Wilfried Wintsch

  3. Institute for Analytical Chemistry, Technical University Vienna, Getreidemarkt 9, A-1060, Vienna, Austria

    Manfred Grasserbauer

Authors
  1. Peter Wilhartitz
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  2. Wilfried Wintsch
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  3. Manfred Grasserbauer
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Wilhartitz, P., Wintsch, W. & Grasserbauer, M. Distribution analysis of trace elements in low alloy steel by means of EPMA, SIMS, and TEM. Mikrochim Acta 91, 477–488 (1987). https://doi.org/10.1007/BF01199522

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  • DOI: https://doi.org/10.1007/BF01199522

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