Characterization of high purity gallium

Abstract

Multi-step wet analytical procedures were tested on gallium samples of different purity grades. Results obtained were compared with those of spark source mass spectrometry (SSMS) and glow discharge mass spectrometry (GDMS). It was found that multi-step procedures, as applied, with preconcentration factors of 200 are suitable to determine most of the detectable elements in high purity gallium in the ng/g-range. The results thus obtained agree well with those obtained by mass spectrometry. The sensitivity of the multi-step and mass spectrometry methods is not sufficient to detect traces of the investigated elements in super purity gallium, i.e. better than 6 N. These qualities can be differentiated, however, by single crystal resistivity measurement.