1. Reconstructing the energy spectra of backscattered electrons with allowance for the spectrometer’s response function

   • N. A. Koshev
   • N. A. Orlikovskii
   • A. G. Yagola

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 959 - 964

2. Automating the mode of the electron-probe control of templates for imprint lithography

   • V. V. Kazmiruk
   • T. N. Savitskaya

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 965 - 969

3. Experimental cathodoluminescence studies of exciton transport in gallium nitride

   • A. N. Polyakov
   • M. Noltemeyer
   • M. A. Stepovich

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 970 - 973

4. Allowing for matrix effects in local electron-probe analysis using a new model of the distribution function for the depth of characteristic X-ray radiation

   • N. N. Mikheev
   • M. A. Stepovich
   • E. V. Shirokova

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 974 - 977

5. Prospects for using cathodoluminescence in SEM to study the distribution and types of breakdown in glass insulators

   • A. V. Kuz’menkov
   • P. V. Ivannikov
   • A. I. Gabel’chenko

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 978 - 982

6. Precision depth profiling of nanoelectronic structures using secondary molecular ions in secondary-ion mass spectrometry

   • A. N. Pustovit
   • A. F. Vyatkin

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 983 - 986

7. Analyzing SEM collection efficiency

   • O. D. Potapkin
   • A. A. Melnikov

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 987 - 990

8. Electron beam lithography with a Gaussian current distribution for nanolithography

   • O. D. Potapkin

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 991 - 994

9. Investigating the optical properties of a near-surface layer in silicon implanted by zinc after thermal annealing

   • V. V. Privezentsev
   • M. V. Chukichev
   • Yu. V. Krivenkov

   Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 995 - 998

10. Electron tomography and morphological analysis of the structure of multicomponent amorphous and nanocrystalline alloys

    • O. V. Voitenko
    • E. B. Modin
    • L. B. Sosnovskaya

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 999 - 1001

11. Investigation of silicon-on-sapphire structures by means of TEM

    • D. A. Pavlov
    • P. A. Shilyaev
    • A. I. Bobrov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1002 - 1004

12. Studying the structure of nanocomposites obtained via the chemical decomposition of metal siloxanes in polymer matrices

    • B. G. Zavin
    • N. V. Cherkun
    • E. M. Belavtseva

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1005 - 1008

13. Determining the young modulus of nanosize thickness coatings for MEMS from the results of static force spectroscopy

    • S. O. Abetkovskaya
    • S. A. Chizhik
    • Ya. Linke

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1009 - 1011

14. In-situ investigation of the structure of electrolitically deposited cobalt-phosporous alloy upon heating

    • E. B. Modin
    • O. V. Voitenko
    • L. B. Sosnovskaya

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1012 - 1014

15. Eliminating distortions of nonperiodic structures in images

    • B. N. Grudin
    • S. V. Dolzhikov
    • S. V. Polishuk

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1015 - 1019

16. Simulation and analysis of images using spectral characteristics

    • B. N. Grudin
    • V. S. Plotnikov
    • S. V. Polishuk

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1020 - 1024

17. Characterizing the structure of Co/Cu and NiFe/Cu multilayered magnetic nanowires

    • E. B. Modin
    • O. V. Voitenko
    • L. B. Sosnovskaya

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1025 - 1026

18. Effect of electron irradiation on fluorides of alkali-earth elements (CaF₂, SrF₂ and BaF₂)

    • V. I. Nikolaichik
    • B. P. Sobolev
    • A. S. Avilov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1027 - 1031

19. Cationic nonstoichiometry of oxides of the Ba-Cu-O and Y-Ba-Cu-O systems

    • V. I. Nikolaichik
    • L. A. Klinkova
    • N. V. Barkovskii

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1032 - 1035

20. Growth and properties of GaAs and GaN films and low-dimensional GaAs/QWsInGaAs structures on Si substrates with a Ge buffer layer

    • Yu. N. Buzynin
    • V. G. Shengurov
    • S. A. Denisov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1036 - 1040

21. Studying the characteristics of the photosensitive elements of photodetector matrices based on Si Pt: Si by means of induced potential and transmission electron microscopy

    • A. N. Buzynin
    • V. P. Kalinushkin
    • A. P. Lytkin

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1041 - 1044

22. Surface tension of melts of binary alkali element systems: The sodium-cesium system

    • B. B. Alchagirov
    • P. Kh. Arkhesov
    • Kh. B. Khonovov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1045 - 1047

23. Structural defects on a 1T-TiSe₂ surface: Experiment and model calculation of photoelectron diffraction

    • A. S. Razinkin
    • I. I. Ogorodnikov
    • M. N. Kuznetsov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1048 - 1050

24. Features of the specific resistance of nanocomposite films fabricated from multiwall carbon tubes by means of a directed spinning chuck

    • A. A. Babaev
    • P. P. Khokhlachev
    • N. K. Manabaev

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1051 - 1053

25. Testing effective nucleon-nucleon forces to describe diagonal spin-transfer coefficients for the scattering of polarized protons with the excitation of the 1⁺ levels in ¹²C

    • M. S. Onegin
    • A. V. Plavko
    • V. I. Kudryashov

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics 28 September 2012 Pages: 1054 - 1059