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Volume 52, Issue 8
August 2023Includes Special Sections: 19th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XIX). Guest Editors: Naoki Fukata, Hidekazu Tsuchida, Takashi Sekiguchi, Atsushi Ogura; and Advanced Metal Ion Batteries. Guest Editors: Guest Editors: Xinhui Xia and Yongqi Zhang
75 articles in this issue