19th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XIX)

In this topical collection (19 articles)

1. Topical Collection: 19th Conference on Defects (DRIP XIX)

   Extended Defects in SiC: Selective Etching and Raman Study

   J. L. Weyher, A. Tiberj, G. Nowak, J. C. Culbertson… Pages 5039-5046

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2. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Investigation of Comet-Shaped Defects in an EPI-InP Layer Grown on S-Doped and Fe-Doped InP Substrates

   Lijie Liu, Youwen Zhao, Jingming Liu, Yingli Wang… Pages 5047-5052

3. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Fabrication and Luminescence Characterization of Ge Wires with Uniaxial Tensile Strains Applied using Internal Stresses in Deposited Metal Thin Films

   Takayoshi Shimura, Shogo Tanaka, Takuji Hosoi… Pages 5053-5058

4. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Trench-Filling Epitaxy of Germanium on (001) Silicon Enhanced Using [100]-Oriented Patterns

   Kota Kato, Kazuki Motomura, Jose A. Piedra-Lorenzana… Pages 5066-5074

5. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Cathodoluminescence Study of 3C-SiC Epilayers Grown on 4H-SiC Substrates

   Jun Chen, Hiroyuki Sazawa, Wei Yi, Takashi Sekiguchi Pages 5075-5083

6. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Contribution of 90° Si-Core Partial Dislocation to Asymmetric Double-Rhombic Single Shockley-Type Stacking Faults in 4H-SiC Epitaxial Layers

   Johji Nishio, Chiharu Ota, Ryosuke Iijima Pages 5084-5092

7. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Relationship Between Propagation Angle of Dislocations in β-Ga₂O₃ (001) Bulk Wafers and Their Etch Pit Shapes

   Sou Isaji, Issei Maeda, Naoya Ogawa, Ryo Kosaka… Pages 5093-5098

8. Topical Collection: 19th Conference on Defects (DRIP XIX)

   Micro- and Nanostructure Analysis of Vapor-Phase-Grown AlN on Face-to-Face Annealed Sputtered AlN/Nanopatterned Sapphire Substrate Templates

   Yudai Nakanishi, Yusuke Hayashi, Takeaki Hamachi… Pages 5099-5108

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9. 

   Topical Collection: 19th Conference on Defects (DRIP XIX)

   Stacking Fault Expansion from an Interfacial Dislocation in a 4H-SiC PIN Diode and Its Expansion Process

   Chiharu Ota, Johji Nishio, Aoi Okada, Ryosuke Iijima Pages 5109-5120

10. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Crystalline Morphology of SiGe Films Grown on Si(110) Substrates

    Keisuke Arimoto, Chihiro Sakata, Kosuke O. Hara… Pages 5121-5127

11. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film

    M. Chino, R. Yokogawa, A. Ogura, H. Uchiyama… Pages 5128-5133

12. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Low-Temperature Growth of ZnMgO Thin Films by Atmospheric Spin-Coating Using Diethylzinc Solution

    Kenji Yoshino, Himeka Tominaga, Yuta Komaki, Masato Imai… Pages 5134-5139

13. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Evaluation of Strain-Relaxation of Carbon-Doped Silicon Nanowires and Its Crystal Orientation Dependence Using X-Ray Diffraction Reciprocal Space Mapping

    Kazutoshi Yoshioka, Ichiro Hirosawa, Takeshi Watanabe… Pages 5140-5149

14. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Analysis of InGaAs/InP p-I-n Photodiode Failed by Electrostatic Discharge

    Yuta Ito, Ryo Yokogawa, Osamu Ueda, Naomi Sawamoto… Pages 5150-5158

15. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Electrical Properties of Silicon Oxide Layers Subjected to High-Temperature Treatment Reproducing the Growth Conditions for Thin Carbon Films

    M. A. Knyazev, O. A. Soltanovich, D. M. Sedlovets… Pages 5159-5165

16. Topical Collection: 19th Conference on Defects (DRIP XIX)

    Excitation Transfer from Cr²⁺ to Fe²⁺ Ions in Co-doped ZnSe as a Pumping Scheme for Infrared Solid-State Lasers

    Jens W. Tomm, Günter Steinmeyer, Pia Fürtjes… Pages 5166-5171

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17. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Experimental Study on the Photoelastic Coefficient and Its Wavelength Dispersion for Quantitative Imaging of Residual Strain in Commercial SiC Substrates

    Masayuki Fukuzawa, Nobuya Kudo Pages 5172-5177

18. Topical Collection: 19th Conference on Defects (DRIP XIX)

    Investigation of Doping Processes to Achieve Highly Doped Czochralski Germanium Ingots

    Aravind Subramanian, Nikolay Abrosimov, Alexander Gybin… Pages 5178-5188

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19. 

    Topical Collection: 19th Conference on Defects (DRIP XIX)

    Comparison of Outdoor and Indoor PL and EL Images in Si Solar Cells and Panels for Defect Detection and Classification

    C. Terrados, D. González-Francés, V. Alonso… Pages 5189-5198