Physics, Fabrication, and Applications of Multilayered Structures

  • P. Dhez
  • C. Weisbuch

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Growth and Characterization of Multilayer Structure

  3. Physics of Multilayer Structure

    1. Front Matter
      Pages 111-111
    2. R. H. Williams
      Pages 171-197
    3. Frans Spaepen
      Pages 199-214
    4. E. Kasper, H. J. Herzog, F. Schäffler
      Pages 229-238
  4. Applications of Multilayer Structure

    1. Front Matter
      Pages 239-239
    2. Eberhard Spiller
      Pages 271-309
    3. F. Mezei
      Pages 311-333
  5. Structural Studies and Fabrication

    1. Front Matter
      Pages 335-335
    2. G. Faraci, A. R. Pennisi, A. Terrasi, S. Mobilio, A. Balerna
      Pages 337-337

About this book


Low-dimensional materials are of fundamental interest in physics and chemistry and have also found a wide variety of technological applica­ tions in fields ranging from microelectronics to optics. Since 1986, several seminars and summer schools devoted to low-dimensional systems have been supported by NATO. The present one, Physics, Fabrication and Applications of Multilayered structures, brought together specialists from different fields in order to review fabrication techniques, charac­ terization methods, physics and applications. Artificially layered materials are attractive because alternately layering two (or more) elements, by evaporation or sputtering, is a way to obtain new materials with (hopefully) new physical properties that pure materials or alloys do not allow. These new possibilities can be ob­ tained in electronic transport, optics, magnetism or the reflectivity of x-rays and slow neutrons. By changing the components and the thickness of the layers one can track continuously how the new properties appear and follow the importance of the multilayer structure of the materials. In addition, with their large number of interfaces the study of inter­ face properties becomes easier in multilayered structures than in mono­ layers or bilayers. As a rule, the role of the interface quality, and also the coupling between layers, increases as the thickness of the layer decreases. Several applications at the development stage require layer thicknesses of just a few atomic layers.


X-ray chemistry crystal crystal structure development electron fields magnetism neutron optics scattering semiconductor structure superconductivity thin films

Editors and affiliations

  • P. Dhez
    • 1
  • C. Weisbuch
    • 2
  1. 1.Paris UniversityOrsayFrance
  2. 2.Thomson CSFOrsayFrance

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag US 1988
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-0093-0
  • Online ISBN 978-1-4757-0091-6
  • About this book