Volume 47, Issue 9

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September 2018

Special Section: 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII). Guest Editors: Oscar Martínez Sacristán, Martina Baeumler, Deren Yang, Ute Zeimer, Jean-Pierre Landesman, Helena Castan Lanaspa

95 articles in this issue

Aims and Scope of JEM, Embracing the Past and Looking Toward the Future
John Baniecki
F. Shahedipour-Sandvik
Editorial Commentary 12 June 2018 Pages: 4937 - 4937
The Role of Defects in the Resistive Switching Behavior of Ta₂O₅-TiO₂-Based Metal–Insulator–Metal (MIM) Devices for Memory Applications
S. Dueñas
H. Castán
J. Aarik
Topical Collection: 17th Conference on Defects (DRIP XVII) 07 February 2018 Pages: 4938 - 4943
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Depth Profile of Impurity Phase in Wide-Bandgap Cu(In_1−x,Ga_x)Se₂ Film Fabricated by Three-Stage Process
Shenghao Wang
Takehiro Nazuka
Takeaki Sakurai
Topical Collection: 17th Conference on Defects (DRIP XVII) 15 February 2018 Pages: 4944 - 4949
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Electrical Characterization of Graphite/InP Schottky Diodes by I–V–T and C–V Methods
Stanislav Tiagulskyi
Roman Yatskiv
Jan Grym
Topical Collection: 17th Conference on Defects (DRIP XVII) 20 February 2018 Pages: 4950 - 4954
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
Iván Santos
Manuel Ruiz
Lourdes Pelaz
Topical Collection: 17th Conference on Defects (DRIP XVII) 26 February 2018 Pages: 4955 - 4958
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
Jens W. Tomm
Robert Kernke
Bruno Acklin
Topical Collection: 17th Conference on Defects (DRIP XVII) 26 February 2018 Pages: 4959 - 4963
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl₂/CH₄ Plasma Chemistry
Jean-Pierre Landesman
Daniel T. Cassidy
Alfredo Torres
Topical Collection: 17th Conference on Defects (DRIP XVII) 26 February 2018 Pages: 4964 - 4969
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Defect-Related Electroluminescence in the 1.2–1.7 μm Range from Boron-Implanted Silicon at Room Temperature
Yuhan Gao
Hao Shen
Deren Yang
Topical Collection: 17th Conference on Defects (DRIP XVII) 09 March 2018 Pages: 4970 - 4974
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Band-Like Behavior of Localized States of Metal Silicide Precipitate in Silicon
Anton Bondarenko
Oleg Vyvenko
Topical Collection: 17th Conference on Defects (DRIP XVII) 19 March 2018 Pages: 4975 - 4979
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices
L. J. Brillson
G. M. Foster
M. W. Allen
Topical Collection: 17th Conference on Defects (DRIP XVII) 19 March 2018 Pages: 4980 - 4986
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Optical Characterizations of VCSEL for Emission at 850 nm with Al Oxide Confinement Layers
Merwan Mokhtari
Philippe Pagnod-Rossiaux
Daniel T. Cassidy
Topical Collection: 17th Conference on Defects (DRIP XVII) 22 March 2018 Pages: 4987 - 4992
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals
H. García
H. Castán
G. González-Díaz
Topical Collection: 17th Conference on Defects (DRIP XVII) 28 March 2018 Pages: 4993 - 4997
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method
Guiying Shen
Youwen Zhao
Xiaoyu Chen
Topical Collection: 17th Conference on Defects (DRIP XVII) 28 March 2018 Pages: 4998 - 5001
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Influence of the Interaction Between Graphite and Polar Surfaces of ZnO on the Formation of Schottky Contact
R. Yatskiv
J. Grym
Topical Collection: 17th Conference on Defects (DRIP XVII) 28 March 2018 Pages: 5002 - 5006
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Observation of Threading Dislocations in Ammonothermal Gallium Nitride Single Crystal Using Synchrotron X-ray Topography
Y. Yao
Y. Ishikawa
K. Hirano
Topical Collection: 17th Conference on Defects (DRIP XVII) 02 April 2018 Pages: 5007 - 5012
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Electrical Characterization of Defects Created by γ-Radiation in HfO₂-Based MIS Structures for RRAM Applications
H. García
M. B. González
A. Faigón
Topical Collection: 17th Conference on Defects (DRIP XVII) 02 April 2018 Pages: 5013 - 5018
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Effect of Germanium Doping on the Production and Evolution of Divacancy Complexes in Neutron Irradiated Czochralski Silicon
Peng Dong
Ping Yang
Jian Zhang
Topical Collection: 17th Conference on Defects (DRIP XVII) 14 May 2018 Pages: 5019 - 5024
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Design and Photovoltaic Properties of Graphene/Silicon Solar Cell
Dikai Xu
Xuegong Yu
Deren Yang
Topical Collection: 17th Conference on Defects (DRIP XVII) 06 April 2018 Pages: 5025 - 5032
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Characterization of the Failure Site Distribution in MIM Devices Using Zoomed Wavelet Analysis
J. Muñoz-Gorriz
S. Monaghan
E. Miranda
Topical Collection: 17th Conference on Defects (DRIP XVII) 16 May 2018 Pages: 5033 - 5038
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Effects of Iron Contamination and Hydrogen Passivation on the Electrical Properties of Oxygen Precipitates in CZ-Si
Jiyang Li
Lihui Song
Deren Yang
Topical Collection: 17th Conference on Defects (DRIP XVII) 25 April 2018 Pages: 5039 - 5044
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
W and X Photoluminescence Centers in Crystalline Si: Chasing Candidates at Atomic Level Through Multiscale Simulations
María Aboy
Iván Santos
Lourdes Pelaz
Topical Collection: 17th Conference on Defects (DRIP XVII) 25 April 2018 Pages: 5045 - 5049
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Evaluation of Anisotropic Biaxial Stress Induced Around Trench Gate of Si Power Transistor Using Water-Immersion Raman Spectroscopy
Takahiro Suzuki
Ryo Yokogawa
Atsushi Ogura
Topical Collection: 17th Conference on Defects (DRIP XVII) 03 May 2018 Pages: 5050 - 5055
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Determination of Low C Concentration in Czochralski-Grown Si for Solar Cell Applications by Liquid-N-Temperature Photoluminescence After Electron Irradiation
Michio Tajima
Hirotatsu Kiuchi
Atsushi Ogura
Topical Collection: 17th Conference on Defects (DRIP XVII) 04 May 2018 Pages: 5056 - 5060
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Cathodoluminescence Characterization of Dilute Nitride GaNSbAs Alloys
A. Navarro
O. Martinez
C. Algora
Topical Collection: 17th Conference on Defects (DRIP XVII) 30 May 2018 Pages: 5061 - 5067
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Phosphorus Diffusion Gettering Efficacy in Upgraded Metallurgical-Grade Solar Silicon
A. Jiménez
C. del Cañizo
A. Peral
Topical Collection: 17th Conference on Defects (DRIP XVII) 11 May 2018 Pages: 5068 - 5071
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Electromagnetic Field Enhancement on Axially Heterostructured NWs: The Role of the Heterojunctions
J. L. Pura
J. Souto
J. Jiménez
Topical Collection: 17th Conference on Defects (DRIP XVII) 14 May 2018 Pages: 5072 - 5076
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells
L. A. Sánchez
A. Moretón
J. Jiménez
Topical Collection: 17th Conference on Defects (DRIP XVII) 22 May 2018 Pages: 5077 - 5082
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
GaSb and GaSb/AlSb Superlattice Buffer Layers for High-Quality Photodiodes Grown on Commercial GaAs and Si Substrates
M. Gutiérrez
F. Lloret
D. Araújo
Topical Collection: 17th Conference on Defects (DRIP XVII) 22 May 2018 Pages: 5083 - 5086
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Photoluminescent Tomography of Semiconductors by Two-Photon Confocal Microscopy Technique
V. P. Kalinushkin
O. V. Uvarov
A. A. Gladilin
Topical Collection: 17th Conference on Defects (DRIP XVII) 08 June 2018 Pages: 5087 - 5091
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Impact of Carbon Codoping on Generation and Dissociation of Boron–Oxygen Defects in Czochralski Silicon
Meng Xie
Xuegong Yu
Deren Yang
Topical Collection: 17th Conference on Defects (DRIP XVII) 07 June 2018 Pages: 5092 - 5098
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Non-destructive Detection of Screw Dislocations and the Corresponding Defects Nucleated from Them During SiC Epitaxial Growth and Their Effect on Device Characteristics
H. Das
S. Sunkari
H. Naas
Topical Collection: 17th Conference on Defects (DRIP XVII) 12 June 2018 Pages: 5099 - 5104
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Photoconductivity of Macroporous and Nonporous Silicon with Ultrathin Oxide Layers
K. P. Konin
Yu. V. Goltvyansky
D. V. Morozovs’ka
Topical Collection: 17th Conference on Defects (DRIP XVII) 12 June 2018 Pages: 5105 - 5108
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Analysis and Reduction of Obtuse Triangular Defects on 150-mm 4° 4H-SiC Epitaxial Wafers
Yongqiang Sun
Gan Feng
Weining Qian
Topical Collection: 17th Conference on Defects (DRIP XVII) 30 June 2018 Pages: 5109 - 5112
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
Generation and Auto-Revealing of Dislocations in Si During Macropore Etching
K. P. Konin
O. Yo. Gudymenko
D. V. Morozovs’ka
Topical Collection: 17th Conference on Defects (DRIP XVII) 16 July 2018 Pages: 5113 - 5117
Part of 1 collection:

17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)
High Voltage Li-Ion Capacitors in a Fluoro-Ether Based Electrolyte System
Bin Liu
Lingzhi Zhu
Han Xu
BriefCommunication 28 June 2018 Pages: 5118 - 5121
Performance of Functionally Graded Thermoelectric Materials and Devices: A Review
Corson L. Cramer
Hsin Wang
Kaka Ma
ReviewPaper 31 May 2018 Pages: 5122 - 5132
Highly Conductive Nano-Silver Circuits by Inkjet Printing
Dongbin Zhu
Minqiang Wu
ReviewPaper 07 June 2018 Pages: 5133 - 5147
Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis
Bruno Lorenzi
Riccardo Dettori
Dario Narducci
OriginalPaper 11 May 2018 Pages: 5148 - 5157
Characterization of the Contamination Factor of Electroless Ni Plating Solutions on the ENIG Process
Hyunju Lee
Jaewook Jung
Yangdo Kim
OriginalPaper 30 May 2018 Pages: 5158 - 5164
From Transparent Conducting Material to Gas-Sensing Application of SnO₂:Sb Thin Films
Soheila Hemmatzadeh Saeedabad
Gurpreet Singh Selopal
Giorgio Sberveglieri
OriginalPaper 30 May 2018 Pages: 5165 - 5173
Thermal, Structural, AC Conductivity, and Dielectric Properties of Ethyl-2-amino-6-ethyl-5-oxo-4-(3-phenoxyphenyl)-5,6-dihydro-4H-pyrano[3,2-c]quinoline-3-carboxylate Thin Films
M. M. El-Shabaan
OriginalPaper 31 May 2018 Pages: 5174 - 5182
Effect of CdTe Back Surface Field on the Efficiency Enhancement of a CGS Based Thin Film Solar Cell
Yousaf Hameed Khattak
Faisal Baig
Tanveer Ahmed
OriginalPaper 31 May 2018 Pages: 5183 - 5190
Enhancement of Sn-Bi-Ag Solder Joints with ENEPIG Surface Finish for Low-Temperature Interconnection
Kelvin P. L. Pun
M. N. Islam
Alan H. S. Chan
OriginalPaper 31 May 2018 Pages: 5191 - 5202
Low-Temperature Sintering Behavior (≤ 400°C) of Micro-sized Silver Particles Decorated by Silver Nanoparticles Through Surface Iodination
Jian Zhou
Hongbo Tang
OriginalPaper 31 May 2018 Pages: 5203 - 5211
Effect of Annealing of Silver Electrodes on Photolithographically Fabricated Silicon Trenches for Photodetection Applications
Navid Azadgar
Nima Naderi
Mohamad Javad Eshraghi
OriginalPaper 31 May 2018 Pages: 5212 - 5217
Four-Element Composite Triangular Dielectric Resonator Antenna Using Li₂O-1.94MgO-0.02Al₂O₃-P₂O₅ Ceramic for Wideband Applications
Preeti Kumari
Pankaj Tripathi
Devendra Kumar
OriginalPaper 31 May 2018 Pages: 5218 - 5228
Critical Evaluation of Relative Importance of Stress and Stress Gradient in Whisker Growth in Sn Coatings
Piyush Jagtap
Vijay A. Sethuraman
Praveen Kumar
OriginalPaper 31 May 2018 Pages: 5229 - 5242
Multilayered Electromagnetic Interference Shielding Structures for Suppressing Magnetic Field Coupling
Atom O. Watanabe
Pulugurtha Markondeya Raj
Rao Tummala
OriginalPaper 31 May 2018 Pages: 5243 - 5250
Influence of Annealing Ambient on the Photoelectric and Photoelectrochemical Properties of TiO₂ Nanorod Arrays
Yulong Zhao
Xiuquan Gu
Yinghuai Qiang
OriginalPaper 31 May 2018 Pages: 5251 - 5258
The Role of the Substrate on Photophysical Properties of Highly Ordered 15R-SiC Thin Films
Satyendra Mourya
Jyoti Jaiswal
Ramesh Chandra
OriginalPaper 01 June 2018 Pages: 5259 - 5268

Volume 47, Issue 9

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