1. 15th International Conference on Micro- and Nanoelectronics October 2–6, 2023 Zvenigorod, Moscow Region, Russia

   • Editorial Board

   EDITORIAL 21 March 2024 Pages: S1 - S1

   

2. Natural Edge Bilayer Graphene Transistor

   • I. K. Domaratskiy
   • M. A. Kashchenko
   • D. A. Svintsov

   DEVICES: TRANSISTORS 21 March 2024 Pages: S2 - S5

   

3. Accounting for Carrier Mobility Reduction due to the Normal Field in the Saturation Current Modeling of Extrinsic MOSFETs

   • V. O. Turin
   • Y. V. Ilyushina
   • S. V. Makarov

   DEVICES: TRANSISTORS 21 March 2024 Pages: S6 - S13

   

4. Investigation of the Influence of the Buffer Layer Design in a GaN HEMT Transistor on the Breakdown Characteristics

   • D. M. Kurbanbaeva
   • A. V. Lashkov
   • K. A. Tsarik

   DEVICES: TRANSISTORS 21 March 2024 Pages: S14 - S19

   

5. Calculation of Electrophysical Characteristics of Semiconductor Quantum Wire Device Structures with One-Dimensional Electron Gas

   • D. V. Pozdnyakov
   • A. V. Borzdov
   • V. M. Borzdov

   DEVICES: TRANSISTORS 21 March 2024 Pages: S20 - S29

   

6. Memristors Based on GeSi_xO_y Glass Films on p+-Si Substrate

   • V. A. Volodin
   • I. D. Yushkov
   • M. Vergnat

   DEVICES: MEMORY 21 March 2024 Pages: S30 - S37

   

7. Buffer Layers for Nonvolatile Ferroelectric Memory Based on Hafnium Oxide

   • A. A. Reznik
   • A. A. Rezvanov
   • S. S. Zyuzin

   DEVICES: MEMORY 21 March 2024 Pages: S38 - S43

   

8. Flux-Driven Traveling-Wave Parametric Amplifier with bi-SQUIDs Cells

   • V. K. Kornev
   • N. V. Kolotinskiy
   • A. N. Nikolaeva

   DEVICES: SUPERCONDUCTIVITY 21 March 2024 Pages: S44 - S52

   

9. Strontium Iridates as Barrier Materials for Josephson Heterostructures

   • Y. V. Kislinskii
   • K. Y. Constantinian
   • G.A. Ovsyannikov

   DEVICES: SUPERCONDUCTIVITY 21 March 2024 Pages: S53 - S58

   

10. Atypical Raman Scattering on Magnetic Junctions in Metallic Nanowires

    • V. Krishtop
    • V. Korepanov
    • I. Doludenko

    DEVICES: MAGNETICS 21 March 2024 Pages: S59 - S66

    

11. Magnetic Properties of Ni Nanowires in Porous Anodic Alumina Matrix

    • E. A. Grushevski
    • N. G. Savinski
    • L. A. Shendrikova

    DEVICES: MAGNETICS 21 March 2024 Pages: S67 - S70

    

12. Artificial Magnetism in Theory of Wave Multiple Scattering by Random Ensemble of Nonmagnetic Spheres with Negative Dielectric Permittivity

    • M. Yu. Barabanenkov
    • A. G. Italyantsev

    DEVICES: MAGNETICS 21 March 2024 Pages: S71 - S75

    

13. New Applications of Thermomigration in Semiconductor Technologies and Optoelectronics Developments (Review)

    • E. Yu. Buchin
    • Yu. I. Denisenko

    DEVICES: PHOTONICS 21 March 2024 Pages: S76 - S83

    

14. Photovoltaic Effect in ITO/Germanosilicate Glass/Si Structures

    • V. A. Volodin
    • G. N. Kamaev
    • M. Vergnat

    DEVICES: PHOTONICS 21 March 2024 Pages: S84 - S91

    

15. Nanophotonics Devices Functioned in Frame of the X-ray Waveguide-Resonance Propagation Phenomenon

    • V. Egorov
    • E. Egorov

    DEVICES: PHOTONICS 21 March 2024 Pages: S92 - S98

    

16. Optical Properties of ZnO–LiNbO₃ and ZnO–LiNbO₃:Fe Structures

    • Sh. B. Utamuradova
    • Z. T. Azamatov
    • M. A. Yuldoshev

    DEVICES: PHOTONICS 21 March 2024 Pages: S99 - S103

    

17. Interaction of Electromagnetic Radiation with a Semiconductor Nanolayer in the Case of an Arbitrary Rotation Axis Orientation of an Constant Energy Ellipsoid

    • O. V. Savenko
    • I. A. Kuznetsova

    DEVICES: PHOTONICS 21 March 2024 Pages: S104 - S109

    

18. 2D Geometrical Parameters of Asymmetric Plasmonic Crescent-Shaped Nanostructures Fabricated with Colloidal Nanolithography

    • V. P. Kudrya

    DEVICES: PHOTONICS 21 March 2024 Pages: S110 - S114

    

19. Finite-Element Simulation of the Performance of a Temperature-Compensated Membrane-Based Thermal Flow Sensor

    • V. Koshelev
    • G. Demin
    • V. Ryabov

    DEVICES: MEMS AND SENSORS 21 March 2024 Pages: S115 - S120

    

20. Simulation of the Silicon Sensitive Element of Capacitive Accelerometer Using the Analytical Model

    • Paing Soe Thu
    • V. V. Kalugin
    • E. S. Kochurina

    DEVICES: MEMS AND SENSORS 21 March 2024 Pages: S121 - S128

    

21. Modeling of Heat Transfer for a Three-Dimensional Microelectromechanical Mirror Element with Consideration of Its Packaging Features

    • S. S. Evstafyev
    • V. K. Samoylikov
    • D. V. Vertyanov

    DEVICES: MEMS AND SENSORS 21 March 2024 Pages: S129 - S133

    

22. Analysis of the Electrophysical Characteristics of the RF MEMS Switch Taking into Account the Influence of the Substrate Material

    • I. O. Dryagin
    • A. M. Belevtsev
    • V. F. Lukichev

    DEVICES: MEMS AND SENSORS 21 March 2024 Pages: S134 - S138

    

23. Piezoelectric Properties of Nitrogen-Doped Carbon Nanotubes Grown on Refractory Metal Electrodes

    • O. I. Soboleva
    • S. A. Khubezhov
    • M. V. Il̒ina

    DEVICES: MEMS AND SENSORS 21 March 2024 Pages: S139 - S144

    

24. Terahertz All-Dielectric Metalens: Design and Fabrication Features

    • E. Yu. Gusev
    • V. S. Klimin
    • O. A. Ageev

    DEVICES: THz 21 March 2024 Pages: S145 - S150

    

25. Investigation of the Characteristics of a Wireless Communication System Consisting of Metal Nanoantennas in 50 µM TSV Channel

    • D. A. Serov
    • I. A. Khorin

    DEVICES: THz 21 March 2024 Pages: S151 - S158

    

26. Development of a Mathematical Apparatus with an Imagery Representation of Information for Neuromorphic Systems

    • N. A. Simonov

    DEVICES: NEUROMORPHIC SYSTEMS 21 March 2024 Pages: S159 - S162

27. Informational Analytical Platform for Operating the Technological Route of Manufacturing of Microelectronic Devices

    • K. S. Balizh
    • A. V. Dobrodeev
    • E. A. Simakhina

    TECHNOLOGIES: GENERAL PROCESSES 21 March 2024 Pages: S163 - S167

    

28. Technological Approaches for Formation of High-Density Integral Capacitors: Deep Etching and Atomic Layer Deposition

    • A. Miakonkikh
    • S. Pankratov
    • K. Rudenko

    TECHNOLOGIES: GENERAL PROCESSES 21 March 2024 Pages: S168 - S175

    

29. Sublimation Mechanism for Polishing Silicon Carbide Wafers by Electron Beam

    • A. Atamanchuk
    • S. Avdeev
    • O. Ageev

    TECHNOLOGIES: GENERAL PROCESSES 21 March 2024 Pages: S176 - S178

30. Simulating Longitudinal Temperature Bistability in a Silicon Wafer during Thermal Treatment in a Lamp Chamber

    • V. V. Ovcharov
    • V. P. Prigara
    • A. L. Kurenya

    TECHNOLOGIES: GENERAL PROCESSES 21 March 2024 Pages: S179 - S183

    

31. Computer Modeling of Plasma-Enhanced Atomic Layer Deposition of HfO₂ and ZrO₂

    • S. S. Zyuzin
    • E. A. Ganykina
    • E. S. Gornev

    TECHNOLOGIES: THIN FILMS 21 March 2024 Pages: S184 - S193

    

32. Ion-Assisted Magnetron Deposition of AlN Films

    • R. V. Selyukov
    • V. V. Naumov

    TECHNOLOGIES: THIN FILMS 21 March 2024 Pages: S194 - S198

    

33. Effect of Vacuum Annealing on Orientation of Fluorite Films on Tilted-Axes Substrates

    • P. B. Mozhaev
    • J. B. Hansen
    • C. S. Jacobsen

    TECHNOLOGIES: THIN FILMS 21 March 2024 Pages: S199 - S208

    

34. Electrostatic-Assisted Ultrasonic Spray-Coating for Nanotechnology Applications

    • V. Petukhov
    • N. Struchkov
    • V. Nevolin

    TECHNOLOGIES: THIN FILMS 21 March 2024 Pages: S209 - S214

    

35. Ruthenium for Subtractive and Semi-Damascene Processes of Interconnects Formation

    • A. Rogozhin
    • A. Miakonkikh
    • K. Rudenko

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S215 - S219

    

36. Rhenium Effect in Thin Films and Wires of Tungsten–Rhenium Alloys

    • A. V. Timakov
    • V. I. Shevyakov

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S220 - S223

    

37. Investigation of the Features of Metallization Formation for N-MOS Transistor Structures with a Vertical Channel

    • V. S. Gornostay-Polsky
    • V. I. Shevyakov

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S224 - S227

    

38. Technology of Metallization of the Structure of a Semiconductor Device by a Composition of Nanosized Metal Layers

    • A. R. Shakhmayeva
    • E. Kazalieva

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S228 - S231

    

39. Effect of Surfactant and Solvent on the Pore Structure of Organosilica Glass Film

    • D. S. Seregin
    • A. S. Vishnevskiy
    • K. A. Vorotilov

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S232 - S239

    

40. Investigation of Gas Condensation in Pores of Nanoporous Dielectrics in Cryogenic Etching Conditions

    • R. A. Gaidukasov
    • A. V. Miakonkikh

    TECHNOLOGIES: METALLIZATION 21 March 2024 Pages: S240 - S245

    

41. Proposals for Development of the Prospective System for Optical Quality Control of the Assembly of Microelectronic Devices

    • K. S. Balizh
    • P. M. Eremeev
    • E. A. Simakhina

    DIAGNOSTICS 21 March 2024 Pages: S246 - S250

    

42. Research and Analysis of Thermomechanical Stresses in the Structure of a Wafer with Embedded ICs with Consideration of Temperature Effects in Manufacturing Process Route

    • S. S. Evstafyev
    • I. A. Solovyov
    • D. V. Vertyanov

    DIAGNOSTICS 21 March 2024 Pages: S251 - S256

    

43. Study of Topographic Features, Shape, and Mechanical Stresses in Microelectronic Structures Using Geomorphometric Techniques

    • A. A. Dedkova
    • I. V. Florinsky

    DIAGNOSTICS 21 March 2024 Pages: S257 - S262

    

44. Digital Shearograph for Detecting Defect in Materials

    • Z. T. Azamatov
    • V. E. Gaponov
    • A. B. Bakhromov

    DIAGNOSTICS 21 March 2024 Pages: S263 - S266

    

45. Ion Beams and X-ray Methods for the Planar Nanostructures Diagnostics

    • V. Egorov
    • E. Egorov

    DIAGNOSTICS 21 March 2024 Pages: S267 - S273

    

46. Investigation of Low Energy Electron Irradiated SiO₂ Based MOS Devices by Capacitance-Voltage and Thermally Stimulated Current Techniques

    • R. Aliasgari Renani
    • O. A. Soltanovich
    • S. V. Koveshnikov

    DIAGNOSTICS 21 March 2024 Pages: S274 - S278

    

47. Technique of Time Depend Dielectric Breakdown for the Wafer-Level Testing of Thin Dielectrics of MIS Devices

    • D. V. Andreev
    • V. M. Maslovsky
    • V. V. Andreev

    DIAGNOSTICS 21 March 2024 Pages: S279 - S284

    

48. Some Properties of Argon as an Actinometric Atom. I. Metastable Levels Excitation

    • V. P. Kudrya

    DIAGNOSTICS 21 March 2024 Pages: S285 - S289

    

49. Some Properties of Argon as an Actinometric Atom. II. Metastable Levels Quenching

    • V. P. Kudrya

    DIAGNOSTICS 21 March 2024 Pages: S290 - S298

50. A Mass-in-Mass Chain and the Generalization of the Dirac Equation with an Eight-Component Wave Function and with Optical and Acoustic Branches of the Dispersion Relation

    • V. O. Turin
    • Y. V. Ilyushina
    • I. V. Nazritsky

    QUANTUM INFORMATICS: PHYSICS 21 March 2024 Pages: S299 - S305