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Genome-wide association mapping for seedling and field resistance to Puccinia striiformis f. sp. tritici in elite durum wheat

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Genome-wide association analysis in tetraploid wheat revealed novel and diverse loci for seedling and field resistance to stripe rust in elite spring durum wheat accessions from worldwide.

Abstract

Improving resistance to stripe rust, caused by Puccinia striiformis f. sp. tritici, is a major objective for wheat breeding. To identify effective stripe rust resistance loci, a genome-wide association study (GWAS) was conducted using 232 elite durum wheat (Triticum turgidum ssp. durum) lines from worldwide breeding programs. Genotyping with the 90 K iSelect wheat single nucleotide polymorphism (SNP) array resulted in 11,635 markers distributed across the genome. Response to stripe rust infection at the seedling stage revealed resistant and susceptible accessions present in rather balanced frequencies for the six tested races, with a higher frequency of susceptible responses to United States races as compared to Italian races (61.1 vs. 43.1% of susceptible accessions). Resistance at the seedling stage only partially explained adult plant resistance, which was found to be more frequent with 67.7% of accessions resistant across six nurseries in the United States. GWAS identified 82 loci associated with seedling stripe rust resistance, five of which were significant at the false discovery rate adjusted P value <0.1 and 11 loci were detected for the field response at the adult plant stages in at least two environments. Notably, Yrdurum-1BS.1 showed the largest effect for both seedling and field resistance, and is therefore considered as a major locus for resistance in tetraploid wheat. Our GWAS study is the first of its kind for stripe rust resistance in tetraploid wheat and provides an overview of resistance in elite germplasm and reports new loci that can be used in breeding resistant cultivars.

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Acknowledgements

This project was partially supported by the Durable Rust Resistance in Wheat Project managed by Cornell University with funds from the Bill and Melinda Gates Foundation, the Department for International Development of the United Kingdom and the AGER Agroalimentare e Ricerca—Project ‘From seed to pasta—Multidisciplinary approaches for a more sustainable and high-quality durum wheat production’. Support for Weizhen Liu was provided by the China Scholarship Council, the Washington Grain Commission, and by Washington State University. We thank our colleagues John Kuehner, Wycliffe Nyongesa, Victor Demacon and Kent Evans for maintaining stripe rust screening nurseries, Anmin Wan and Yumei Liu for assisting in greenhouse tests, Simona Corneti and Sandra Stefanelli for assisting in laboratory analysis and stripe rust field sampling. We also appreciate Shiaoman Chao in USDA-ARS Cereal Crops Research for genotyping this panel using 90 K wheat SNP chip.

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Authors and Affiliations

  1. Department of Crop and Soil Sciences, Washington State University, Pullman, WA, 99164-6420, USA

    Weizhen Liu, Peter Bulli, Sheri Rynearson & Michael Pumphrey

  2. Department of Agricultural Sciences, University of Bologna, 40127, Bologna, Italy

    Marco Maccaferri & Roberto Tuberosa

  3. Wheat Health, Genetics, and Quality Research Unit, USDA-ARS, Pullman, WA, 99164-6430, USA

    Xianming Chen

  4. Department of Plant Pathology, Washington State University, Pullman, WA, 99164-6430, USA

    Xianming Chen

Authors
  1. Weizhen Liu
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  2. Marco Maccaferri
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  3. Peter Bulli
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  4. Sheri Rynearson
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  5. Roberto Tuberosa
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  6. Xianming Chen
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  7. Michael Pumphrey
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Corresponding authors

Correspondence to Weizhen Liu or Michael Pumphrey.

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The authors declare that the research was conducted in the absence of any commercial or financial relationships that could be construed as a potential conflict of interest.

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Communicated by Frank Ordon.

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Liu, W., Maccaferri, M., Bulli, P. et al. Genome-wide association mapping for seedling and field resistance to Puccinia striiformis f. sp. tritici in elite durum wheat. Theor Appl Genet 130, 649–667 (2017). https://doi.org/10.1007/s00122-016-2841-9

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  • DOI: https://doi.org/10.1007/s00122-016-2841-9

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