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Identification of Yr59 conferring high-temperature adult-plant resistance to stripe rust in wheat germplasm PI 178759

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This manuscript reports a new gene for non-race-specific resistance to stripe rust and molecular markers for incorporating it into wheat cultivars for control of the disease with durable resistance.

Abstract

Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive wheat diseases worldwide. The spring wheat germplasm ‘PI 178759’ originating from Iraq showed effective resistance to stripe rust in field evaluations over 8 years in Washington state, USA. To map the resistance gene(s), PI 178759 was crossed with ‘Avocet Susceptible’, and the parents and 176 F2:3 lines were phenotyped in the fields under natural infection and in a greenhouse with selected races of P. striiformis f. sp. tritici. PI 178759 was identified to have high-temperature adult-plant (HTAP) resistance. Resistance gene analog polymorphism and simple sequence repeat techniques were used to identify molecular markers linked to the resistance gene and a chromosome region was mapped using a quantitative trait locus approach. One major gene was mapped to the long arm of chromosome 7B. Flanked by Xwgp5175 and Xbarc32 in a 2.1 cM region, the gene explained 31.8 and 54.7 % of the phenotypic variation in rAUDPC and IT, respectively. Based on genetic distances among markers and allelism tests, the HTAP resistance gene in PI 178759 is different from the previously reported Yr39, Yr52, YrZH84, and YrC591, also located on chromosome 7BL, and is therefore designated as Yr59. The gene and its flanking markers should be useful for developing wheat cultivars with durable resistance.

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Acknowledgments

This research was supported by the US Department of Agriculture, Agricultural Research Service (Project No. 5348-22000-015-00D), National Key Basic Research Program of China (2013CB127700), Washington Wheat Commission (Project No. 13C-3061-3923) and Vogel Foundation (Project No. 13Z-3061- 3824). We thank Ms. Lu Hou for technical assistance and Dr. Robert McIntosh for critical review of the manuscript. A scholarship to Xinli Zhou from the China Scholarship Council was greatly appreciated. The research is also part of a Northwest A&F University Plant Pathology ‘‘111’’ Project (B07049).

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None.

Ethical standard

All experiments were conducted in Pullman, Washington, the USA, and part of data analyses and manuscript development were done at Northwest A&F University. All authors have contributed to the study and approved the version for submission. The manuscript has not been submitted to any other journal.

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Authors and Affiliations

  1. State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, People’s Republic of China

    X. L. Zhou, Y. Lu, Z. S. Kang & J. X. Jing

  2. Department of Plant Pathology, Washington State, University, Pullman, WA, 99164-6430, USA

    X. L. Zhou, M. N. Wang, X. M. Chen & Y. Lu

  3. Wheat Genetics, Quality, Physiology and Disease Research Unit, US Department of Agriculture, Agricultural Research Service, Pullman, WA, 99164-6430, USA

    X. M. Chen

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  1. X. L. Zhou
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  2. M. N. Wang
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  3. X. M. Chen
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  4. Y. Lu
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  5. Z. S. Kang
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  6. J. X. Jing
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Correspondence to X. M. Chen.

Additional information

Communicated by T. Miedaner.

X. L. Zhou and M. N. Wang made equal contributions.

Mention of trade names or commercial products in this publication is solely for the purpose of providing specific information and does not imply recommendation or endorsement by the US Department of Agriculture. USDA is an equal opportunity provider and employer.

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Zhou, X.L., Wang, M.N., Chen, X.M. et al. Identification of Yr59 conferring high-temperature adult-plant resistance to stripe rust in wheat germplasm PI 178759. Theor Appl Genet 127, 935–945 (2014). https://doi.org/10.1007/s00122-014-2269-z

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