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Genetics and molecular mapping of genes for race-specific all-stage resistance and non-race-specific high-temperature adult-plant resistance to stripe rust in spring wheat cultivar Alpowa

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Abstract

Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most widespread and destructive wheat diseases worldwide. Growing resistant cultivars is the preferred control of the disease. The spring wheat cultivar ‘Alpowa’ has both race-specific, all-stage resistance and non-race-specific, high-temperature adult-plant (HTAP) resistances to stripe rust. To identify genes for the stripe rust resistances, Alpowa was crossed with ‘Avocet Susceptible’ (AVS). Seedlings of the parents, and F1, F2 and F3 progeny were tested with races PST-1 and PST-21 of P. striiformis f. sp. tritici under controlled greenhouse conditions. Alpowa has a single partially dominant gene, designated as YrAlp, conferring all-stage resistance. Resistance gene analog polymorphism (RGAP) and simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrAlp. A linkage group of five RGAP markers and two SSR markers was constructed for YrAlp using 136 F3 lines. Amplification of a set of nulli-tetrasomic Chinese Spring lines with RGAP markers Xwgp47 and Xwgp48 and the two SSR markers indicated that YrAlp is located on the short arm of chromosome 1B. To map quantitative trait loci (QTLs) for the non-race-specific HTAP resistance, the parents and 136 F3 lines were tested at two sites near Pullman and one site near Mount Vernon, Washington, under naturally infected conditions. A major HTAP QTL was consistently detected across environments and was located on chromosome 7BL. Because of its chromosomal location and the non-race-specific nature of the HTAP resistance, this gene is different from previously described genes for adult-plant resistance, and is therefore designated Yr39. The gene contributed to 64.2% of the total variation of relative area under disease progress curve (AUDPC) data and 59.1% of the total variation of infection type data recorded at the heading-flowering stages. Two RGAP markers, Xwgp36 and Xwgp45 with the highest R 2 values were closely linked to Yr39, should be useful for incorporation of the non-race-specific resistance gene into new cultivars and for combining Yr39 with other genes for durable and high-level resistance.

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Acknowledgments

This research was supported by the US Department of Agriculture, Agricultural Research Service, Vogel Foundation and Washington Wheat Commission. PPNS No. 0421, Department of Plant Pathology, College of Agricultural, Human, and Natural Resource Sciences Research Center, Project Nos. 13Z-3061-3824 and 13C-30613923, Washington State University, Pullman, WA 99164-6430, USA. We are grateful to D. Wood, L. Penman, Y.M. Liu, V. Pahalawatta, Dr. P. Ling, Dr. D. Santra and Dr. L. Reddy for their technical assistance. We also would like to thank Drs. R.E. Allan, R.F. Line and R.A. McIntosh for their critical review of the manuscript.

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Authors and Affiliations

  1. Department of Plant Pathology, Washington State University, Pullman, WA, 99164-6430, USA

    F. Lin & X. M. Chen

  2. Bioscience and Technology College, Shenyang Agricultural University, Shenyang, China

    F. Lin

  3. U.S. Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, WA, 99164-6430, USA

    X. M. Chen

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  1. F. Lin
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Correspondence to X. M. Chen.

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Communicated by A. Graner.

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Lin, F., Chen, X.M. Genetics and molecular mapping of genes for race-specific all-stage resistance and non-race-specific high-temperature adult-plant resistance to stripe rust in spring wheat cultivar Alpowa. Theor Appl Genet 114, 1277–1287 (2007). https://doi.org/10.1007/s00122-007-0518-0

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