X-ray intensity distribution in the image plane of elliptic multilayer mirrors A. D. AkhsakhalyanV. A. Murav’evN. N. Salashchenko OriginalPaper Pages: 235 - 239
Diffraction reflection of x-ray radiation with a two-dimensionally bounded wavefront from perfect crystals V. A. BushuevA. P. Oreshko OriginalPaper Pages: 240 - 246
Role of the dislocation screw component in the formation of the dislocation structure in Ge- and Si-based semiconductor heterosystems E. M. TrukhanovA. V. KolesnikovA. K. Gutakovsky OriginalPaper Pages: 247 - 254
X-ray study of structural features of GaSb(Si) single crystals grown using a set of diffraction methods under various heat and mass transfer conditions I. A. ProkhorovYu. A. SerebryakovI. L. Shul’pina OriginalPaper Pages: 255 - 259
X-ray topography study of microsegregation in crystals I. A. ProkhorovI. Z. BezbakhI. L. Shul’pina OriginalPaper Pages: 260 - 264
X-ray spherical wave scattering patterns of the epitaxial Si/GeSi/Si (001) heterosystem A. S. IlinA. P. VasilenkoA. A. Fedorov OriginalPaper Pages: 265 - 268
TEM study of the structure of gallium nitride epitaxial films grown on substrates with different interface morphologies A. A. SitnikovaS. G. KonnikovT. Lang OriginalPaper Pages: 269 - 272
Simulation of the spatial structure of x-ray beams under conditions of the correction of the heat flow incident on a crystal A. S. MarkelovV. N. TrushinA. A. Zholudev OriginalPaper Pages: 273 - 276
Wavelet processing of topographic high dynamic range images V. A. Tkal’A. O. OkunevL. N. Danil’chuk OriginalPaper Pages: 277 - 285
Computer study of the temperature dependence of physical properties of noncrystalline silicon nanoparticles A. E. GalashevI. A. IzmodenovA. N. Novruzov OriginalPaper Pages: 286 - 293
Features of the formation of thermal donors in silicon under elastic tensile stress I. I. NovakG. A. Oganesyan OriginalPaper Pages: 294 - 297
Microanalysis station at the Kurchatov synchrotron radiation source A. N. ArtemievN. A. ArtemievA. A. Dyatlov OriginalPaper Pages: 298 - 302
New type of regular carbon nanostructures: Nanocones on the surfaces of carbon-silicon (a-C:H) composite films V. D. FrolovS. M. PimenovG. G. Kirpilenko OriginalPaper Pages: 303 - 306
Fabrication of x-ray masks on a thick substrate for deep x-ray lithography E. V. PetrovaB. G. Gol’denbergV. V. Lyakh OriginalPaper Pages: 307 - 311
Study of the process of PbS nanocrystal formation in lead stearate and behenate Langmuir-Blodgett films by electron diffraction and x-ray reflectometry V. V. KlechkovskayaL. G. YanusovaV. V. Volkov OriginalPaper Pages: 312 - 317
Structure and radiation properties of dislocations arising during oxygen precipitate growth in silicon E. A. SteinmanA. N. TereshchenkoV. Ya. Reznik OriginalPaper Pages: 318 - 322
Effect of surface excitations on the reflection electron energy loss spectrum in silicon A. S. ParshinG. A. AleksandrovaA. V. Zyuganova OriginalPaper Pages: 323 - 327
Sputtering of boron nitride single crystals of different structure V. E. YurasovaS. S. ElovikovE. Yu. Zykova OriginalPaper Pages: 328 - 341
Mass spectrometry study of the kinetics of CdTe molecular-beam epitaxy: Part I. Cd, Te2, and CdTe V. I. MikhailovL. E. PolyakV. M. Kanevskii OriginalPaper Pages: 342 - 347
Simulation of the MFM contrast from small low-coercive ferromagnetic nanoparticles in an external field V. L. MironovD. S. NikitushkinP. A. Zhdan OriginalPaper Pages: 348 - 351
Magnetic force microscopy of GaAs:Mn ferromagnetic semiconductors D. O. FilatovE. I. Malysheva OriginalPaper Pages: 352 - 358
Nanocrystalline Ni-Mn solid solutions: New materials with competing exchange interaction Yu. A. BabanovV. P. PilyuginT. Ogasavara OriginalPaper Pages: 359 - 361
Off-plane grazing-incidence blazed grating with radial grooves as an efficient spectral purity filter for EUV lithography L. I. Goray OriginalPaper Pages: 362 - 367