Skip to main content
SpringerLink
Log in

X-ray intensity distribution in the image plane of elliptic multilayer mirrors

  • Published:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Aims and scope Submit manuscript

Abstract

The x-ray intensity distribution in the image plane of a multilayer elliptical cylinder and ellipsoid-revolution mirrors was studied Analytical expressions for calculating this distribution were derived as a function of the size of the source, its position with respect to the mirror, and the microroughness of the multilayer structure.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. M. Schuster and H. Gobel, Bruker Report 145, 9 (1998).

    Google Scholar 

  2. G. Gutman, L. Jiang, and B. Verman, US Patent US006041099A Single Coner Kirkpatrick-Baez Beam Conditioning Optic Assembly Osmic, Inc., Troy. Mich. (21 March 2000).

  3. A. A. Akhsakhalyan, A. D. Akhsakhalyan, E. B. Klyuenkov, et al., Izv. Akad. Nauk, Ser. Fiz. 69(2), 174 (2005).

    CAS  Google Scholar 

  4. A. D. Akhsakhalyan, E. B. Klyuenkov, V. A. Muravjev, and N. N. Salashchenko, Poverkhnost. Rentgen. Sinkhrotr. Neitron. Issled. 2, 28 (2005).

    Google Scholar 

  5. R. Siebrecht, A. Dariel, D. Cenada, et al., in Proc. 7th Int. Conf. Physics of Multilayer Structures. Rusutsu Report (Sapporo, Japan, 2004), O5-04.

  6. A. A. Akhsakhalyan, A. D. Akhsakhalyan, E. B. Klyuenkov, et al., in Mater. simp. “Nanofizika i nanoelektronika” (Nizhn. Novgorod, 2006), p. 362.

  7. Mirror Rontgen Optics, Ed. by A. V. Vinogradov (Mashinostroenie, Leningrad, 1989) [in Russian].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhni Novgorod, 603950, Russia

    A. D. Akhsakhalyan, V. A. Murav’ev & N. N. Salashchenko

Authors
  1. A. D. Akhsakhalyan
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. A. Murav’ev
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. N. N. Salashchenko
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Original Russian Text © A.D. Akhsakhalyan, V.A. Murav’ev, N.N. Salashchenko, 2007, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 5, pp. 3–8.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Akhsakhalyan, A.D., Murav’ev, V.A. & Salashchenko, N.N. X-ray intensity distribution in the image plane of elliptic multilayer mirrors. J. Surf. Investig. 1, 235–239 (2007). https://doi.org/10.1134/S1027451007030019

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1027451007030019

Keywords

Search

Navigation