Skip to main content
Log in

Abstract

For a 6H-SiC single crystal, experimental results of the digital processing of topographic images with various dynamic ranges are given. In this case, wavelet analysis was used. The images were obtained by x-ray topography based on the Borrmann effect and were presented in 8-, 16-, and 32-bit formats. It is shown that, on eliminating the experimental contrast granularity, 32-bit images turn out to be more convenient for decoding and contain more useful information about structure defects of a single crystal under study as compared to the 8- and 16-bit images. The wavelet analysis efficiency increases considerably for the digital processing of separate topogram fragments and depends on the choice of the region and the size of the reference image.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. L. N. Danil’chuk, V. A. Tkal’, A. O. Okunev, et al., Numerical Processing of Rontgenotopographic Polarized-Optical Images of Monocrystal Structure Defects (NovGU, Novgorog, 2004).

    Google Scholar 

  2. L. N. Danilchuk, Yu. A. Drozdov, A. O. Okunev, et al., Zav. Lab. Diagnostika Materialov 11, 26 (2003).

    Google Scholar 

  3. V. A. Tkal’, A. O. Okunev, Ya. S. Belekhov, et al., Zav. Lab. Diagnostika Materialov 72(7), 22 (2006).

    CAS  Google Scholar 

  4. http://zhurnal.ape.relarn.ru/articles/2005/211.pdf.

  5. L. N. Danilchuk, A. O. Okunev, and V. A. Tkal, Rontgen Difraction Defects Topography in Crystals on the Base of Borrmann Effect (NovGU, Novgorod, 2006).

    Google Scholar 

  6. L. N. Danilchuk, A. O. Okunev, V. A. Tkal, et al., Rontgen Topography of Silicon on the Base of Film Interferometry of Epitaxial Systems and Borrmann Effect (NovGU, Novgorod, 2006).

    Google Scholar 

  7. V. A. Tkal’, A. O. Okunev, L. N. Danilchuk, et al., in Mater. 3-go nauch. seminara “Modern Methods of Difraction Data Analysis (Rontgenotopography, Diffractometry, Electronic Microscopy)” (Velikii Novgorod, 2006), p. 254.

  8. V. A. Tkal’, A. O. Okunev, L. N. Danilchuk, et al., in Mater. 3-go nauch. seminara “Modern Methods of Difraction Data Analysis (Rontgenotopography, Diffractometry, Electronic Microscopy)” (Velikii Novgorod, 2006), p. 249.

  9. V. A. Tkal’, A. O. Okunev, L. N. Danilchuk, et al., in Mater. 3-go nauch. seminara “Modern Methods of Difraction Data Analysis (Rontgenotopography, Diffractometry, Electronic Microscopy)” (Velikii Novgorod, 2006), p. 259.

  10. P. E. Debevec and J. Malik, in Proc. of SIGGRAPH-97, Computer Graphics Proc., Annual Conf. Ser. (Addison Wesley, Los Angeles, 1997), p. 369.

    Book  Google Scholar 

  11. V. I. Vorob’ev and V. G. Gribunin, Theory and Practice of Wavelet-Transformation (VUS, St. Petersburg, 1999) [in Russian].

    Google Scholar 

  12. P. I. Rudakov and V. I. Safonov, Processing of Signals and Images. MATLAB 5.X (Dialog-MIFI, Moscow, 2000) [in Russian].

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Additional information

Original Russian Text © V.A. Tkal’, A.O. Okunev, M.N. Petrov, L.N. Danil’chuk, 2007, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 5, pp. 64–73.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Tkal’, V.A., Okunev, A.O., Petrov, M.N. et al. Wavelet processing of topographic high dynamic range images. J. Surf. Investig. 1, 277–285 (2007). https://doi.org/10.1134/S1027451007030093

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1027451007030093

Keywords

Navigation