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X-ray topography study of microsegregation in crystals

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Abstract

Concentration microinhomogeneities in crystals were characterized using x-ray topography, digital image processing, and spectral analysis of signals. Based on the features in lattice strains in such layered inhomogeneous crystals, methods for optimizing the conditions of x-ray topography detection of growth striations were proposed to obtain quantitative information on the composition fluctuation amplitude and spatial characteristics.

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Authors and Affiliations

  1. Research Center Space Materials Science, Branch of Shubnikov Institute of Crystallography, Russian Academy of sciences, Kaluga, 248640, Russia

    I. A. Prokhorov, I. Z. Bezbakh & B. G. Zakharov

  2. Ioffe Physico-Technical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    I. L. Shul’pina

Authors
  1. I. A. Prokhorov
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  2. I. Z. Bezbakh
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  3. B. G. Zakharov
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  4. I. L. Shul’pina
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Additional information

Original Russian Text © I.A. Prokhorov, I.Z. Bezbakh, B.G. Zakharov, I.L. Shul’pina, 2007, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 5, pp. 42–46.

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Prokhorov, I.A., Bezbakh, I.Z., Zakharov, B.G. et al. X-ray topography study of microsegregation in crystals. J. Surf. Investig. 1, 260–264 (2007). https://doi.org/10.1134/S1027451007030056

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  • DOI: https://doi.org/10.1134/S1027451007030056

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