1. Preface

   • A. Armigliato
   • L. Van't dach
   • J. Wernisch

   EditorialNotes Pages: 1 - 2

2. Correction procedures in electron probe microanalysis of bulk samples

   • Peter Duncumb

   Invited Speakers Pages: 3 - 20

3. Recent progress in quantitative and high spatial resolution AES

   • Siegfried Hofmann

   Invited Speakers Pages: 21 - 32

4. Standardless X-ray analysis of bulk specimens

   • Jean-Louis Pouchou

   Invited Speakers Pages: 33 - 52

5. Standardless quantitation of thin film specimens

   • W. A. Patrick Nicholson

   Invited Speakers Pages: 53 - 70

6. Electron energy loss spectrometry mapping

   • Christian Colliex
   • Marcel Tencé
   • Christian Jeanguillaume

   Invited Speakers Pages: 71 - 87

7. Quantitative analysis of films by ion microbeam methods. I: RBS, NRA, and channeling

   • Antonio V. Drigo

   Invited Speakers Pages: 89 - 106

8. Quantitative analysis of films by ion microbeam methods. II: SIMS

   • Helmut Werner

   Invited Speakers Pages: 107 - 127

9. Quantitative microbeam analysis of particles

   • Piezze Van Espen

   Invited Speakers Pages: 129 - 142

10. Environmental scanning electron microscopy and microanalysis

    • Gerasimos D. Danilatos

    Invited Speakers Pages: 143 - 155

11. Composition of vanadium carbides formed by solidification in ternary Fe-V-C alloys

    • Sif Eddine Amara
    • Rafika Kesri
    • Sylvaine Hamar-Thibault

    Contributed Papers Pages: 157 - 164

12. Investigation of implanted gallium depth distributions in ZnS_xSe_-x by EPMA

    • Norbert Ammann
    • Götz Gleitsmann
    • Peter Karduck

    Contributed Papers Pages: 165 - 173

13. Electron and ion beam analysis of composition and strain in Si_-x Ge _x /Si heterostructures

    • Aldo Armigliato
    • Donato Govoni
    • Antonio V. Drigo

    Contributed Papers Pages: 175 - 185

14. X-Ray emission modulation by electron channelling and site occupancy in garnets

    • Roberto Balboni
    • Stefano Frabboni
    • Sandra Spigarelli

    Contributed Papers Pages: 187 - 194

15. Quantitative EPMA of element depth distribution

    • Alexander Berner
    • Guy Proaktor

    Contributed Papers Pages: 195 - 203

16. Influence of channeling effects on ion distribution and damage profiles during high energy ion implantation in Si

    • A. Carnera
    • A. Gasparotto
    • R. Fabbri

    Contributed Papers Pages: 205 - 211

17. Surface and interface analysis of titanium nitride diffusion barriers

    • Marco Bonelli
    • Antonio Miotello
    • Alberto Carnera

    Contributed Papers Pages: 213 - 220

18. Determining the local coordination of aluminium in cement using electron energy loss near-edge structure

    • Rik Brydson
    • Ian G. Richardson
    • Geoffrey W. Groves

    Contributed Papers Pages: 221 - 229

19. Elaboration and characterisation of yttria psz coatings deposited by RF sputtering on silicon

    • Patrice Chainiau
    • Eric Beauprez
    • Marie-Christine Sainte Catherine

    Contributed Papers Pages: 231 - 238

20. Changes in depth profiles of oxygen and copper in Y-Ba-Cu-O film under annealing

    • Leonid P. Chernenko
    • Alexander P. Kobzev
    • Dmitri M. Shirokov

    Contributed Papers Pages: 239 - 245

21. Damage in Y-Ba-Cu-O films produced by⁴He ions

    • Leonid P. Chernenko
    • Alexander P. Kobzev
    • Dmitri M. Shirokov

    Contributed Papers Pages: 247 - 254

22. An EELS and EXELFS study of amorphous hydrogenated silicon carbide

    • Allison Cook
    • Alexander G. Fitzgerald
    • Philip John

    Contributed Papers Pages: 255 - 260

23. Theoretical simulation of backscattered electron images of Si/Si_xGe_1-x structures with a scanning electron microscope

    • Angela C. De Riccardis
    • Pier Giorgio Merli
    • Leander Tapfer

    Contributed Papers Pages: 261 - 266

24. Analysis of light elements in superposed layers by Monte Carlo simulation of EELS spectra

    • Agostino Desalvo
    • Rodolfo Rosa
    • Andrea Parisini

    Contributed Papers Pages: 267 - 275

25. Quantitative EPMA and TEM of unsupported films

    • Johannes M. Dijkstra
    • Guillaume F. Bastin
    • Dick Klepper

    Contributed Papers Pages: 277 - 284

26. Silicate particles engulfed in human alveolar macrophages: An analytical electron microscopy study

    • Marco Diociaiuti
    • Mario Falchi
    • Luigi Paoletti

    Contributed Papers Pages: 285 - 291

27. Quantification of the electron beam damage of thin films

    • Luděk Frank

    Contributed Papers Pages: 293 - 303

28. Monte Carlo correction programme for PC

    • Ondrej Gedeon
    • Vaclav Hulinsky

    Contributed Papers Pages: 305 - 311

29. Performance of a nuclear microprobe to study giant marine aerosol particles

    • Jasna Injuk
    • Lothar Breitenbach
    • Uwe Wätjen

    Contributed Papers Pages: 313 - 321

30. The role of coating densities in X-ray microanalysis

    • Karel Jurek
    • Oldrich Renner
    • Eduard Krouský

    Contributed Papers Pages: 323 - 326

31. Analytical, structural and electrical characterization of SiGe layers by electron microbeam techniques

    • Martin Kittler
    • Jürgen Lärz

    Contributed Papers Pages: 327 - 334

32. Homogeneity studies of powders and plasma sprayed deposits

    • Blahoslav Kolman
    • Jiří Forman
    • Pavel Chráska

    Contributed Papers Pages: 335 - 342

33. X-ray emission spectroscopy with EPMA applied to high T_c Superconductors using new spectrometer crystals

    • A. Kottmann
    • P. Lamparter
    • S. Steeb

    Contributed Papers Pages: 343 - 351

34. Microprecipitation in boron-containing high-carbon steels

    • Laurence Lanier
    • Gérard Metauer
    • Mohamed Moukassi

    Contributed Papers Pages: 353 - 361

35. An accurate computer correction program for quantitative electron probe microanalysis

    • Claude Merlet

    Contributed Papers Pages: 363 - 376

36. Investigation of various SiC materials by means of EPMA/WDS techniques

    • Pietro Moretto
    • Pedro Hoffmann

    Contributed Papers Pages: 377 - 388

37. Use of cathode lens in scanning electron microscope for low voltage applications

    • Ilona Müllerová
    • Luděk Frank

    Contributed Papers Pages: 389 - 396

38. Physico-chemical characterization of crystalline phases in fly ashes

    • Luigi Paoletti
    • Marco Diociaiuti
    • Giuseppe Viviano

    Contributed Papers Pages: 397 - 404

39. Electron probe microanalysis of dried biological substances

    • A. Pogorelov
    • V. Pogorelova
    • N. Spiridonov

    Contributed Papers Pages: 405 - 411

40. Spatial resolution limitation in Auger microanalysis of compounds

    • Boris A. Polonsky
    • Oleg D. Protopopov

    Contributed Papers Pages: 413 - 419

41. X-ray microanalysis of thin film layered specimens containing light elements

    • David G. Rickerby
    • Jean-François Thiot

    Contributed Papers Pages: 421 - 429

42. Structural characterization techniques for the analysis of semiconductor strained heterostructures

    • Filippo Romanato
    • Marina Berti
    • Daniele Bertone

    Contributed Papers Pages: 431 - 440

43. PIXE and EMP analyses of volcanites from Nea Kameni island (Aegean Sea, Greece)

    • Alba P. Santo
    • John D. Mac Arthur
    • Piero Manetti

    Contributed Papers Pages: 441 - 452

44. Application of analytical transmission electron microscopy to the characterization of interlayers in fibre-reinforced composites with ceramic and glass matrices

    • Reinhard Schneider
    • Jörg Woltersdorf
    • Andreas Röder

    Contributed Papers Pages: 453 - 461

45. Signal-to-background in EPMA: Measurement and Monte Carlo calculation

    • Vladimir Stary

    Contributed Papers Pages: 463 - 474

46. EPMA analysis of float glass surfaces

    • Anna Stella
    • Marco Verità

    Contributed Papers Pages: 475 - 480

47. SIMS and Auger investigation of oxygen adsorption on polycrystalline nickel surface

    • Zoltán Tass
    • Katalin V. Josepovits

    Contributed Papers Pages: 481 - 484

48. New developments in theory of fast electron scattering in solids: Applications to microbeam analysis

    • I. S. Tilinin
    • W. S. M. Werner

    Contributed Papers Pages: 485 - 503

49. SIMS imaging: Apparatus and applications

    • Alexander B. Tolstogouzov
    • Tatyana I. Kitaeva
    • Stepan S. Volkov

    Contributed Papers Pages: 505 - 510

50. Combined EPMA and AES depth profiling of a multilayer Ti-Al-O-N coating

    • Alexander von Richthofen
    • Michitaka Matsuo
    • Norbert Ammann

    Contributed Papers Pages: 511 - 523