Abstract
The question of destructibility of an ion beam technique applied to the analysis of high temperature superconductors is discussed, namely the influence of the often used analyzing4He ion beam on a monocrystalline YBa2Cu3O7 film. The rate of irradiation defect production is measured for 1 and 3.07 MeV4He+ irradiation and compared with a Monte Carlo simulation. It is shown that the usual depth profiling by4He ion beams does not change the measured element profiles, but is destructive from the view point of the superconducting properties of a sample, due to the great number of defects produced. Using a large solid angle detector one can minimize the analyzing dose to avoid the destruction of superconducting properties.
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Chernenko, L.P., Kobzev, A.P., Korneev, D.A. et al. Damage in Y-Ba-Cu-O films produced by4He ions. Mikrochim Acta 114, 247–254 (1994). https://doi.org/10.1007/BF01244549
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DOI: https://doi.org/10.1007/BF01244549