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Mapping a stripe rust resistance gene YrC591 in wheat variety C591 with SSR and AFLP markers

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Abstract

Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (PST), is one of the most destructive diseases of common wheat (Triticum aestivum L.). To determine inheritance of stripe rust resistance and map the resistance gene(s) in wheat variety C591, F1, F2, and F3 progenies derived from the Taichung 29 × C591 cross were inoculated with Chinese PST race CY32 in the greenhouse. Genetic analysis identified a single dominant gene, temporarily designated YrC591. A total of 178 SSR and 130 AFLP markers were used to test the parents and resistant and susceptible bulks. From the bulk segregant analysis, seven polymorphic SSR and two AFLP markers were selected for genotyping the F2 population. SSR marker Xcfa2040-7B, and SCAR marker SC-P35M48 derived from AFLP marker P35M48 373 were identified to be closely linked to the resistance gene with genetic distances of 8.0 and 11.7 cM, respectively. The SSR markers mapped the resistance gene on chromosome arm 7BL. In the seedling test with five PST races, the reaction patterns of C591 were different from wheat cultivars or lines carrying Yr2 or Yr6 that also are found on chromosome 7B. The results indicate that YrC591 is probably a novel stripe rust resistance gene.

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Acknowledgments

This research was supported by the National Basic Research Program of China (Grant No. 2006CB100203 and G2000016202). We are grateful to Dr. M. S. Röder, IPK of Germany, for friendly providing part of SSR markers used in this study. We also thank Dr. R. A. McIntosh for his valuable advice on our research.

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Authors and Affiliations

  1. State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Sciences, No. 2 West Yuanmingyuan Road, 100193, Beijing, China

    Y. Li & Y. C. Niu

  2. Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, No. 12 South Zhongguancun Street, 100081, Beijing, China

    Y. C. Niu

  3. Institute of Medicinal Plant Development, Chinese Academy of Medical Sciences and Peking Union Medical College, No. 151 North Malianwa Road, 100193, Beijing, China

    Y. Li

  4. USDA-ARS and Department of Plant Pathology, Washington State University, Pullman, WA, 99164-6430, USA

    X. M. Chen

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  1. Y. Li
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  2. Y. C. Niu
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  3. X. M. Chen
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Correspondence to Y. C. Niu.

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Communicated by A. Kilian.

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Li, Y., Niu, Y.C. & Chen, X.M. Mapping a stripe rust resistance gene YrC591 in wheat variety C591 with SSR and AFLP markers. Theor Appl Genet 118, 339–346 (2009). https://doi.org/10.1007/s00122-008-0903-3

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  • DOI: https://doi.org/10.1007/s00122-008-0903-3

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