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Yr45, a new wheat gene for stripe rust resistance on the long arm of chromosome 3D

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Abstract

Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive diseases of wheat worldwide. Growing resistant cultivars is the most effective approach to control the disease, but only a few genes confer effective all-stage resistance against the current populations of the pathogen worldwide. It is urgent to identify new genes for diversifying sources of resistance genes and for pyramiding genes for different types of resistance in order to achieve high levels of durable resistance for sustainable control of stripe rust. The common spring wheat genotype ‘PI 181434’, originally from Afghanistan, was resistant in all greenhouse and field tests in our previous studies. To identify the resistance gene(s) PI 181434 was crossed with susceptible genotype ‘Avocet Susceptible’. Adult plants of 103 F2 progeny were tested in the field under the natural infection of P. striiformis f. sp. tritici. Seedlings of the parents, F2 and F3 were tested with races PST-100 and PST-127 of the pathogen under controlled greenhouse conditions. The genetic study showed that PI 181434 has a single dominant gene conferring all-stage resistance. Resistance gene analog polymorphism (RGAP) and simple sequence repeat (SSR) techniques were used to identify molecular markers linked to the gene. A linkage map of 8 RGAP and 2 SSR markers was constructed for the gene using data from the 103 F2 plants and their derived F3 lines tested in the greenhouse. Amplification of the complete set of nulli-tetrasomic lines and selected ditelosomic lines of Chinese Spring with an RGAP marker and the two SSR markers mapped the gene on the long arm of chromosome 3D. Because it is the first gene for stripe rust resistance mapped on chromosome 3DL and different from all previously named Yr genes, the gene in PI 181434 was designated Yr45. Polymorphism rates of the two closest flanking markers, Xwgp115 and Xwgp118, in 45 wheat genotypes were 73.3 and 82.2%, respectively. Single nucleotide polymorphisms (SNPs) were identified in the eight wheat genotypes sharing both flanking markers. The RGAP markers and potential SNP markers should be useful in incorporating the gene into wheat cultivars and in pyramiding it with other genes for durable resistance.

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Acknowledgments

This research was supported by the US Department of Agriculture, Agricultural Research Service (Project No. 5348-22000-014-00D), Washington Wheat Commission (Project No. 13C-3061-3923), and Vogel Foundation (Project No. 13Z-3061-3824). PPNS No. 0536, Department of Plant Pathology, College of Agricultural, Human, and Natural Resource Sciences, Agricultural Research Center, Project Number WNP00823, Washington State University, Pullman, WA 99164-6430, USA. The scholarship from China Scholarship Council to Q. Li is appreciated. The research is also part of the Northwest A&F University Plant Pathology “111” Project (B07049). We thank Dr. R.A. McIntosh and Dr. A. Carter for critical reviews of the manuscript.

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Authors and Affiliations

  1. College of Plant Protection and Shaanxi Key Laboratory of Molecular Biology for Agriculture, Northwest A&F University, Yangling, 712100, Shaanxi, China

    Q. Li & J. X. Jing

  2. Department of Plant Pathology, Washington State University, Pullman, WA, 99164, USA

    Q. Li, X. M. Chen & M. N. Wang

  3. Wheat Genetics, Quality Physiology and Disease Research Unit, Agricultural Research Service, US Department of Agriculture, Pullman, WA, 99164-6430, USA

    X. M. Chen

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  1. Q. Li
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  2. X. M. Chen
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  4. J. X. Jing
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Correspondence to X. M. Chen.

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Communicated by A. Graner.

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Li, Q., Chen, X.M., Wang, M.N. et al. Yr45, a new wheat gene for stripe rust resistance on the long arm of chromosome 3D. Theor Appl Genet 122, 189–197 (2011). https://doi.org/10.1007/s00122-010-1435-1

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  • DOI: https://doi.org/10.1007/s00122-010-1435-1

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