Overview
- Presents the new analytical technique of acoustic scanning probe microscopy
- Delivers a comprehensive presentation of all related technical aspects
- Compares the advantages of this new technique with other established scanning probe techniques
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (17 chapters)
Keywords
- AFAM calibration
- AFM instrumental capabilities
- Scanning Microdeformation Microscopy
- acoustic microscopy techniques
- acoustic properties of materials
- biological nanoanalysis
- cantilever dynamics
- dynamics modelling
- holography calibration
- mechanical characterization
- mechanical properties of materials
- nanoanalysis
- quantitative characterization
- scanning probe microscopy
- surface mapping
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Acoustic Scanning Probe Microscopy
Editors: Francesco Marinello, Daniele Passeri, Enrico Savio
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-27494-7
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2013
Hardcover ISBN: 978-3-642-27493-0Published: 04 October 2012
Softcover ISBN: 978-3-642-43079-4Published: 09 November 2014
eBook ISBN: 978-3-642-27494-7Published: 04 October 2012
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XXVI, 494
Topics: Optics, Lasers, Photonics, Optical Devices, Nanotechnology and Microengineering, Acoustics, Nanotechnology, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films