Investigation of the three-dimensional microstructure of Cu-Sn(Pb) diffusion zones by means of ion beam sputtering, scanning electron microscopy and lattice source interferences Siegfried DäbritzWolfgang HauffeRalph Kurt Original Papers Pages: 3 - 12
Quantitative chemical phase imaging by means of energy filtering transmission electron microscopy Werner GroggerFerdinand HoferGerald Kothleitner Original Papers Pages: 13 - 19
Porosity of shapes from hydrothermally treated titania Barbara Röhl-KuhnRüdiger WittmannDietrich Schultze Original Papers Pages: 21 - 24
In situ tempering of melt spun AlGeSi-foils Hans -Dieter BauerWolfgang LöserAngelika Teresiak Original Papers Pages: 25 - 31
An interlaboratory comparison of energy dispersive X-ray microanalysis (EDX) of titanium and zirkonium nitrides M. ProcopA. Röder Original Papers Pages: 33 - 39
Analysis of semiconducting materials by high-resolution radiofrequency glow discharge mass spectrometry Ralf JägerAnatolij I. SaprykinJosé A. C. Broekaert Original Papers Pages: 41 - 44
High performance ultra trace analysis in molybdenum and tungsten accomplished by on-line coupling of ion chromatography with simultaneous ICP-AES Peter WilhartitzSabine DreerOrtwin Bobleter Original Papers Pages: 45 - 52
Solid state reactions in Al based composites made by mechanofusion Ágnes CsanádyAnna Csordás-PintérGyula Vincze Original Papers Pages: 53 - 62
X-ray reflectivity investigations of glass surfaces produced by float and draw techniques Olaf AndersonGerardo H. O. DaalderopKlaus Bange Original Papers Pages: 63 - 67
Investigation of the formation and properties of protective oxide layers on high purity chromium with SIMS imaging techniques Christian BrunnerHerbert HutterManfred Grasserbauer Original Papers Pages: 69 - 72
Deposition of boron nitride on graphite at 1300 K Ewa Pawlas-ForystKrzysztof Fitzner Original Papers Pages: 73 - 77
Combined use of ion beam slope cutting and scanning electron microscopy for the investigation of the 3-dimensional micro-structure of alterated mediaeval glass Evelyn Krawczyk-BärschSiegfried DäbritzWolfgang Hauffe Original Papers Pages: 89 - 91
Concentration profiles of low-index surfaces of PtNi alloys: Results of an improved thermodynamic approach Wilhelm HoferLörinc Z. Mezey Original Papers Pages: 93 - 99
Mass spectrometric analysis of ceramics after decomposition with elemental fluorine Heinrich KipphardtRainer P. H. GartenGünther Tölg Original Papers Pages: 101 - 105
Study of metal containing hydrogenated carbon films by STM/AFM and SAXS Kirsten I. SchiffmannMatthias FrydaGünther Goerigk Original Papers Pages: 107 - 113
Applicability of a Au(50 at%) Ti(50 at%)-alloy for diffusion measurements in the Au-Ti system Katrin RichterKatrin KeiterDieter Ott Original Papers Pages: 115 - 120
Depth profile analysis of plasma assisted CVD hard materials coatings Klaus WetzigIngolf Endler Original Papers Pages: 121 - 125
Study of stressed hard coatings and of their abrasive particles by AES and REM Tamara NiebuhrHenning BubertKnut Kauder Original Papers Pages: 127 - 130
Investigations of precipitates in heat treated AgPd30/CuSn6 layers Martina LorenzDietrich Bergner Original Papers Pages: 131 - 135
Characterization of individual atmospheric particles by element mapping in electron probe microanalysis Stephan WeinbruchMichael WentzelHugo M. Ortner Original Papers Pages: 137 - 141
Morphology, structure and constitution of metastable single-phase Ti1-xAlxN films grown by reactive MSIP Alexander von RichthofenRainer CremerDieter Neuschütz Original Papers Pages: 143 - 148
Preparation, characterization and crystal structure of Na4[Mn(NCS)6]·13H2O Heinz BöhlandHelmut HärtungRegina Matthäus Original Papers Pages: 149 - 152
Mass spectrometric analysis of ceramic components for solid oxide fuel cells Johanna Sabine BeckerJochen WestheideHans -Joachim Dietze Original Papers Pages: 153 - 160
Characterization of modified glassy carbon films Falko SchlottigJoachim SchreckenbachGünter Marx Original Papers Pages: 161 - 163
Surface analysis by TEY — Theory and applications Horst EbelRobert SvageraMaria F. Ebel Original Papers Pages: 165 - 171
Cu-N Films grown by reactive MSIP: Constitution, structure and morphology Alexander von RichthofenRalph DomnickRainer Cremer Original Papers Pages: 173 - 177
Chemical analysis and sensorics with microstructured devices Wolfgang Göpel Original Papers Pages: 179 - 196
Superhard coatings — Production and analysis Benno LuxRoland HaubnerManfred Grasserbauer Original Papers Pages: 197 - 209
X-ray diffraction measurements and depth profiling by secondary neutral mass spectrometry on epitaxially grown high-Tc superconducting thin films H. C. SemmelhackH. BörnerM. Lorenz Original Papers Pages: 211 - 217
Interpretation of Auger depth profiles of thin SiC layers on Si Gernot EckeHans RößlerJörg Pezoldt Original Papers Pages: 219 - 222
Investigation of Al diffusion in different oxide thin-film layers by SNMS/HFM method Hubert PaulusSusanne KornelyKarl -Heinz Müller Original Papers Pages: 223 - 227
A method to correct defocused element distribution maps in electron probe microanalysis M. KlucknerO. BrandlH. M. Ortner Original Papers Pages: 229 - 234
EDX depths analysis of MIS-structures Hans -Joachim FittingJan -Christian KuhrTorsten Barfels Original Papers Pages: 235 - 238
Determination of the stoichiometry and the Yb2+/Yb3+ ratio in YbF x optical IAD films by RBS and in situ XPS analysis A. SchnellbügelB. SelleR. Anton Original Papers Pages: 239 - 243
In-situ characterization of MgLi composite materials by means of AES and factor analysis Stefan BaunackAndreas JohnKlaus Wetzig Original Papers Pages: 245 - 249
Microanalytical characterization of inclusions in Cr-doped LEC GaAs Peter Michael WildeJörg DoneckerPeter Rudolph Original Papers Pages: 251 - 256
Combination of RBS analysis and infrared vibrational spectroscopy for the characterization of semiconducting β-FeSi2 films Michael DöscherGünter OertelUte Troppenz Original Papers Pages: 257 - 261
Defect analysis with positron annihilation — Applications to Fe aluminides Joachim WolffMatthias FranzTheodor Hehenkamp Original Papers Pages: 263 - 268
Optimum parameters in the SNMS high-frequency-mode for the quantitative analysis of thick, non-conducting layers Dieter SommerAlfons Essing Original Papers Pages: 269 - 274
Stresses in alumina scales on NiCrAlY-alloys determined by XSE and LRS Volker R. VosbergMichael G. BergerHubertus Nickel Original Papers Pages: 275 - 278
Diffuse reflectance infrared fourier transform (DRIFT) spectroscopy in the preservation of historical monuments: Studies on salt migration Christian ZeineJoseph Grobe Original Papers Pages: 279 - 282
Electron microscopic phase analysis of BN-thin films M. RöderJ. HahnM. Hietschold Original Papers Pages: 283 - 286
An experimental and theoretical study of surface segregation in a Fe-6at.%Si bicrystal Thomas WeisMarkus M. EislHerbert Störi Original Papers Pages: 287 - 291
Production and characterization of nitrided CVD-SiC films Jens NeuhäuserHermann PlänitzWolfgang Wagner Original Papers Pages: 293 - 296
Some interelement interferences in the chemical analysis of intermetallic γ′ phase isolates using AAS method Andrzej Wyciślik Original Papers Pages: 297 - 300
Application of EPMA to the localization and speciation of mercury in contaminated parts of chemical plants Ulrich WendtHartmut Heyse Original Papers Pages: 301 - 306
Analytical TEM investigations of high-temperature superconductors Jürgen Thomas Original Papers Pages: 307 - 311