Abstract
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The field resistance to Parastagonospora nodorum leaf blotch in SHA3/CBRD is based on many genes with minor effects.
Abstract
Parastagonospora nodorum leaf blotch is a severe wheat disease in Norway and other regions with humid and rainy climate. It causes grain shriveling and reduced yield in years of epidemics. Shanghai-3/Catbird (SHA3/CBRD), a CIMMYT breeding line, was observed to be resistant to P. nodorum leaf blotch in the field. The objective of the current study was to map the genetic factors related to its resistance. A recombinant inbred line population from a cross between SHA3/CBRD and the susceptible German spring cv. Naxos was tested in field trials over 4 years (2010, 2011, 2012 and 2013) with natural infection supplied with mist irrigation. Leaf blotch severity was scored together with plant height, heading date and maturity date in these trials. A testing data set was also available from other field trials with the same population. Totally, two major and six minor QTL were detected for leaf blotch resistance. The major QTL on chromosome 3BL with resistance contributed by Naxos was consistent across all environments and explained up to 12 % of the phenotypic variation. Another major QTL on 3B with resistance from SHA3/CBRD was significant in 2010, 2013 and the testing data set and explained up to 12 % of the phenotypic variation. Minor QTL were detected on 1B, 3AS, 5BS, 5BL, 7A and 7B. The 5BS QTL was likely caused by Snn3-B1, with sensitivity contributed by Naxos. The 5BL QTL mapped to the Tsn1 region, but was likely caused by other mechanisms since both parents were insensitive to ToxA.
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Acknowledgments
This work received funding from the Research Council of Norway and the Norwegian Agricultural Authority (NFR projects 185046 and 224833). Special thanks are given to Anne Guri Marøy for the helpful assistance with the marker genotyping and Yalew Tarkegne for technical help with the field trials. We also thank Tim Friesen for including the parents of the mapping population in toxin assays and providing data on NE sensitivities.
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The authors declare no conflict of interest.
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All experiments included in this study comply with the current laws of the country in which they were performed.
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Communicated by Thomas Miedaner.
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Lu, Q., Lillemo, M. Molecular mapping of adult plant resistance to Parastagonospora nodorum leaf blotch in bread wheat lines ‘Shanghai-3/Catbird’ and ‘Naxos’. Theor Appl Genet 127, 2635–2644 (2014). https://doi.org/10.1007/s00122-014-2404-x
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DOI: https://doi.org/10.1007/s00122-014-2404-x