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Diverse origins of aluminum-resistance sources in wheat

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Abstract

Aluminum (Al) toxicity is a major constraint for wheat production in acidic soils. Wheat producers now routinely use Al-resistant cultivars as one cost-effective means to reduce risks associated with acidic soils. To date, diverse Al-resistant materials have been identified, but their genetic relationship has not been well characterized. A total of 57 wheat accessions, including the majority of the parents of Al-resistant accessions we identified in a previous study, were evaluated for Al resistance and analyzed with 49 simple sequence repeat (SSR) markers and 4 markers for Al-activated malate transporter (ALMT1). Pedigree and principle coordinate analysis (PCA) both separated Al-resistant accessions into four groups labeled according to common ancestry or geographical origin: US-Fultz, Polyssu, Mexican and Chinese. Al resistance in the four groups may have three independent origins given their distinct geographic origins and gene pools. Fultz originated in the USA as a major ancestor to soft red winter wheat, Polyssu originated in Brazil as a major source of Al resistance used in most genetic studies worldwide, and the Chinese group originated in China. Based on ALMT1 marker haplotypes, the Al resistance in the Polyssu and Mexico groups was likely derived from Polyssu, while most Al-resistant cultivars developed in the USA most likely inherited most of Al resistance from Fultz. Fultz was released about 50 years earlier than Polyssu. Norin 10 likely played a pivotal role in passing Al-resistant gene(s) from Fultz to better adapted, semi-dwarf wheat cultivars developed in the USA. Further characterization of Al resistance in the three different sources could reveal multiple Al-resistant mechanisms in wheat.

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Acknowledgments

The authors gratefully acknowledge Dr. J. Yu, Dr. P. St. Amand and Dr. L. Zhou from the USDA Small Grain Genotyping Center at Kansas State University for their technical assistance in marker data analysis. This project is partly funded by the National Research Initiative of the USDA Cooperative State Research, Education and Extension Service, Coordinated Agricultural Project grant number 2006-55606-16629. This paper reports the results of research only. Mention of trade names or commercial products in this article is solely for the purpose of providing specific information and does not imply recommendation or endorsement by the US Department of Agriculture. This is contribution No. 08-171-J of the Kansas Agricultural Experiment Station, Manhattan, KS, USA.

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Correspondence to Gui-Hua Bai.

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Communicated by P. Langridge.

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122_2008_874_MOESM1_ESM.docx

Supplemental Table 1 Number of fragments amplified, amplicon size range, polymorphic information content (PIC), and chromosome locations of the primers used for genetic diversity study (DOCX 15 kb)

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Hu, SW., Bai, GH., Carver, B.F. et al. Diverse origins of aluminum-resistance sources in wheat. Theor Appl Genet 118, 29–41 (2008). https://doi.org/10.1007/s00122-008-0874-4

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