Overview
- Describes in detail the physical mechanisms of CMOS ageing
- Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits
- Presents state-of-the art synthesis algorithms for ageing resilient digital systems
- Introduces application-dependent techniques to mitigate the effects of aging
- Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems
- Includes more than 200 references on state-of-art research in this area, providing direction for further reading
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Table of contents (8 chapters)
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Ageing Physical Mechanisms and Effects
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Ageing Mitigation Techniques
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Ageing Monitoring and Adaptation Techniques
Keywords
About this book
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Editors and Affiliations
About the editor
Bibliographic Information
Book Title: Ageing of Integrated Circuits
Book Subtitle: Causes, Effects and Mitigation Techniques
Editors: Basel Halak
DOI: https://doi.org/10.1007/978-3-030-23781-3
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Nature Switzerland AG 2020
Hardcover ISBN: 978-3-030-23780-6Published: 11 October 2019
Softcover ISBN: 978-3-030-23783-7Published: 12 October 2020
eBook ISBN: 978-3-030-23781-3Published: 30 September 2019
Edition Number: 1
Number of Pages: XIII, 228
Number of Illustrations: 38 b/w illustrations, 107 illustrations in colour
Topics: Circuits and Systems, Processor Architectures, Electronics and Microelectronics, Instrumentation