Overview
Provides different aspects and opinion on a rapidly evolving field
Reviews recent applications of polarimetric techniques to nanomaterials
Written by renomed experts in the field
Includes supplementary material: sn.pub/extras
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Table of contents (21 chapters)
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Ellipsometry at the Nanoscale
Editors: Maria Losurdo, Kurt Hingerl
DOI: https://doi.org/10.1007/978-3-642-33956-1
Publisher: Springer Berlin, Heidelberg
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2013
Hardcover ISBN: 978-3-642-33955-4Published: 28 March 2013
Softcover ISBN: 978-3-662-51971-4Published: 23 August 2016
eBook ISBN: 978-3-642-33956-1Published: 12 March 2013
Edition Number: 1
Number of Pages: XXIV, 730
Topics: Nanotechnology and Microengineering, Measurement Science and Instrumentation, Characterization and Evaluation of Materials, Nanotechnology