Book 2013

Ellipsometry at the Nanoscale

Editors:

ISBN: 978-3-642-33955-4 (Print) 978-3-642-33956-1 (Online)

Table of contents (21 chapters)

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  1. Front Matter

    Pages i-xxiv

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    Chapter

    Pages 1-30

    A Brief History and State of the Art of Ellipsometry

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    Chapter

    Pages 31-143

    Advanced Mueller Ellipsometry Instrumentation and Data Analysis

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    Chapter

    Pages 145-178

    Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

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    Chapter

    Pages 179-202

    Relationship Between Surface Morphology and Effective Medium Roughness

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    Chapter

    Pages 203-224

    Plasmonics and Effective-Medium Theory

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    Chapter

    Pages 225-256

    Thin Films of Nanostructured Noble Metals

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    Chapter

    Pages 257-311

    Spectroscopic Ellipsometry on Metallic Gratings

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    Chapter

    Pages 313-323

    Ellipsometry at the Nanostructure

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    Chapter

    Pages 325-339

    Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles

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    Chapter

    Pages 341-410

    Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition

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    Chapter

    Pages 411-428

    THz Generalized Ellipsometry Characterization of Highly-Ordered Three-Dimensional Nanostructures

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    Chapter

    Pages 429-451

    Infrared Ellipsometric Investigations of Free Carriers and Lattice Vibrations in Superconducting Cuprates

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    Chapter

    Pages 453-491

    Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale

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    Chapter

    Pages 493-527

    Polarimetric and Other Optical Probes for the Solid–Liquid Interface

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    Chapter

    Pages 529-556

    Spectroscopic Ellipsometry for Functional Nano-Layers of Flexible Organic Electronic Devices

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    Chapter

    Pages 557-581

    Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications

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    Chapter

    Pages 583-606

    Ellipsometry of Semiconductor Nanocrystals

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    Chapter

    Pages 607-627

    Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry

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    Chapter

    Pages 629-667

    Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

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    Chapter

    Pages 669-703

    Ellipsometry and Correlation Measurements

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