Abstract
The modeling of surface and interface roughness is a key issue in the interpretation of ellipsometric measurements. Materials properties are often extracted from ellipsometry measurements in an indirect way by modeling the optical response of the material. Since roughness is known to affect the scattering of light on an interface, how roughness is incorporated into these models can affect the outcome of the fitting procedure.
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Acknowledgments
AYG wishes to acknowledge Dr. Jeffrey W. Elam from Argonne National Laboratory for financial support through the Argonne-Northwestern Solar Energy Research (ANSER) Center, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Grant No. DE-SC0001059. Argonne is a U.S. Department of Energy Office of Science Laboratory, and is operated under Grant No. DE-AC02-06CH11357 by UChicago Argonne, LLC.
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A. Terms of the Rayleigh-Rice Theory
A. Terms of the Rayleigh-Rice Theory
Following the notation used in Ref. [14], the kernel functions in the Rayleigh-Rice theory are given by:
where:
and
with:
Here, \(\theta _0\) is the incidence angle, \(k_0\) is the light wavenumber, \(n_0\) and \(n_1\) are the air and the material complex refractive index, and \(r_s\), \(r_p\), \(t_p\), \(t_s\) are the Fresnel reflection and transmission coefficients for the flat interface.
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Yanguas-Gil, A., Wormeester, H. (2013). Relationship Between Surface Morphology and Effective Medium Roughness. In: Losurdo, M., Hingerl, K. (eds) Ellipsometry at the Nanoscale. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33956-1_4
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