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Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles

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Ellipsometry at the Nanoscale

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Abstract

Ferrimagnetic yttrium iron garnet (YIG) thin films incorporating plasmonic Au nanoparticles were prepared. Magneto-optical (MO) Kerr spectroscopy was carried out. The polar MO Kerr spectra in wavelength between 400 and 800 nm show that, by incorporating the Au nanoparticles, Kerr rotation angles become negative values in the region where the localized surface plasmon (LSP) resonance of the Au nanoparticles is located. Spectroscopic ellipsometry was performed and complex electric permittivity (dielectric function, \(\epsilon \)) of the films was obtained. An anomalous dispersion of Re[\(\epsilon \)] is clearly observed in the visible region originating from LSP of Au nanoparticles. The influence of \(\epsilon \) on the MO Kerr properties of the nanocomposite films and the physics underlying the anomalous Kerr rotation are discussed.

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Acknowledgments

The author thank T. Kato, S. Iwata, M. Fujii, S. Hayashi, A. Terai, and N. Nabatova-Gabain for their valuable contribution in this work. The TEM observation by K. Akamatsu, EPMA study by K. Watanabe, and XRD measurement by D. Hashizume are acknowledged. The author is also grateful for fruitful discussions with K. Shinagawa, C. Mitsumata, and S. Ushioda. This work was supported by PRESTO, JST.

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  1. Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), 8916-5 Takayama, Ikoma, Nara, 630-0192, Japan

    Satoshi Tomita

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  1. Satoshi Tomita
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Correspondence to Satoshi Tomita .

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Editors and Affiliations

  1. CNR Bari, Ist. Metodologie Inorganiche, Università Bari, Via Orabona 4, Bari, 70126, Italy

    Maria Losurdo

  2. Zentrum für Oberflächen- und, Nanoanalytik (ZONA), Universität Linz, Linz, 4040, Austria

    Kurt Hingerl

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Tomita, S. (2013). Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles. In: Losurdo, M., Hingerl, K. (eds) Ellipsometry at the Nanoscale. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33956-1_9

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  • DOI: https://doi.org/10.1007/978-3-642-33956-1_9

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