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Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale

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Ellipsometry at the Nanoscale

Abstract

Nanoscale charge transfer is important to both the frontier of fundamental science and to applications in molecular electronics, photonic, electronic, optical, imaging, catalysis, sensing devices, photovoltaics, and energy savings and storage. For many of those applications, plasmonic metal nanoparticles are with molecules and/or semiconductors, where nanoparticles act as an electron-bridge. Metal nanoparticles experience charge transfer either by a hopping mechanism involving transient charging of the nanoparticle and/or by electron storage and delocalization among/in the nanoparticles. This electron transfer affects the electron density in the metal, and the plasmon resonance, and therefore, can be detected spectroscopically. This chapter discusses examples of exploitation of spectroscopic ellipsometry as a real time research tool that advance description and understanding of charge transfer phenomena involving (i) chemisorption of metals on semiconductor surfaces, (ii) growth of plasmonic nanoparticles on polar semiconductors, (iii) coupling plasmonic nanoparticles to graphene, and (iv) charge transfer between plasmonic nanoparticles and biomolecules, activating sensing processes.

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Acknowledgments

The authors acknowledge the European Union 7th Framework Programme for the “NanoCharM” project support and the ONR, DARPA and Italian National Council of Research for financial support over the years through various projects. We also would like to thank our colleagues and students for fruitful collaboration and for many stimulating discussions regarding the use of ellipsometry in real time applications, in particular, Tong-Ho Kim, Pae C Wu and Soojeong Choi (at Duke University) and Pio Capezzuto and Michelaria Giangregorio (at IMIP-CNR).

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Authors and Affiliations

  1. Institute of Inorganic Methodologies and of Plasmas, IMIP, National Council of Research, CNR, IMIP-CNR, via Orabona 4, 70126 , Bari, Italy

    Maria Losurdo & Giovanni Bruno

  2. Electrical and Computer Engineering Department, Duke University, Durham, NC, USA

    April S. Brown

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  1. Maria Losurdo
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Correspondence to Maria Losurdo .

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Editors and Affiliations

  1. CNR Bari, Ist. Metodologie Inorganiche, Università Bari, Via Orabona 4, Bari, 70126, Italy

    Maria Losurdo

  2. Zentrum für Oberflächen- und, Nanoanalytik (ZONA), Universität Linz, Linz, 4040, Austria

    Kurt Hingerl

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Losurdo, M., Brown, A.S., Bruno, G. (2013). Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale. In: Losurdo, M., Hingerl, K. (eds) Ellipsometry at the Nanoscale. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33956-1_13

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  • DOI: https://doi.org/10.1007/978-3-642-33956-1_13

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