Wireless magnetoresistive microsystem for magnetic field measurements V. V. AmelichevA. N. SaurovM. V. Khokhlov OriginalPaper 07 November 2013 Pages: 363 - 367
Technology and electric characteristics of the field-effect hall sensor based on SOI structure L. N. DolgyiI. Yu. LovshenkoV. V. Nelayev OriginalPaper 07 November 2013 Pages: 368 - 372
A threshold position-sensitive photoswitch with negative differential resistance E. V. LychaginS. G. NovikovN. T. Gurin OriginalPaper 07 November 2013 Pages: 373 - 377
Effect of the design and manufacture parameters on the characteristics of a triple-collector bipolar magnetotransistor A. V. KozlovM. A. KorolevR. D. Tikhonov OriginalPaper 07 November 2013 Pages: 378 - 383
Mathematical models and hardware & software for highly accurate electronic temperature meters Yu. I. ShternYa. S. KozhevnikovR. E. Mironov OriginalPaper 07 November 2013 Pages: 384 - 388
Signal conditioning circuitry in ultrahigh-speed photoelectric raster interpolators V. B. Topil’skii OriginalPaper 07 November 2013 Pages: 389 - 395
The analysis of the performance of nanometer intellectual property blocks based on interval simulation S. V. GavrilovO. N. GudkovaA. L. Stempkovskiy OriginalPaper 07 November 2013 Pages: 396 - 402
Use of the effect of phase error accumulation in ring oscillators to estimate time parameters of digital elements of integrated circuits S. O. Churayev OriginalPaper 07 November 2013 Pages: 403 - 407
CMOS-operational amplifier with n-channel output followers, increased gain, and short settling time A. B. Makarov OriginalPaper 07 November 2013 Pages: 408 - 413
Procedure of calculating parameters of sense amplifiers for the EEPROM and flash memory E. S. Vasil’ev OriginalPaper 07 November 2013 Pages: 414 - 419
Laser simulation of volume ionization effects in submicron VLSI circuits P. K. Skorobogatov OriginalPaper 07 November 2013 Pages: 420 - 423
Features of energy release in microvolumes of VLSI elements upon the effect of neutron radiation A. I. ChumakovA. V. AfoninV. A. Polunin OriginalPaper 07 November 2013 Pages: 424 - 427
Probe measurements of the potential distribution in anisotropic semiconductor crystals and films V. V. FilippovA. N. Vlasov OriginalPaper 07 November 2013 Pages: 428 - 432
Probe studies of plasma characteristics in the ICP reactor A. I. VinogradovN. M. ZaryankinS. P. Timoshenkov OriginalPaper 07 November 2013 Pages: 433 - 437
