Abstract
Dependences of electric characteristics on the technological parameters of the field-effect Hall sensors based on SOI structures (FEHS-SOI) are discussed. The manufacturing process for the formation of a magnetosensitive structure comprising the field-effect Hall sensor based on a MOSFET in the SOI structures was simulated. Electrical characteristics of the device were calculated and the optimization research devoted to the influence of process parameters on the FEHS-SOI voltage-current characteristics and sensitivity was made.
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Original Russian Text © L.N. Dolgyi, I.Yu. Lovshenko, V.V. Nelayev, 2013, published in Izvestiya Vysshikh Uchebnykh Zavedenii. Elektronika, 2013, No. 1, pp. 3–9.
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Dolgyi, L.N., Lovshenko, I.Y. & Nelayev, V.V. Technology and electric characteristics of the field-effect hall sensor based on SOI structure. Russ Microelectron 42, 368–372 (2013). https://doi.org/10.1134/S1063739713070056
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DOI: https://doi.org/10.1134/S1063739713070056