1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes Pages: 105 - 105

2. The Comparative and Concurrent Simulation of discrete-event experiments

   • Ernst Ulrich
   • Karen P. Lentz
   • Pier Luca Montessoro

   OriginalPaper Pages: 107 - 118

3. AC strength of a pattern generator

   • Jacob Savir
   • Robert Berry

   OriginalPaper Pages: 119 - 125

4. A test methodology for finite state machines using partial scan design

   • Hyoung B. Min
   • William A. Rogers

   OriginalPaper Pages: 127 - 137

5. Constant testability of combinational cellular tree structures

   • F. Lombardi
   • D. Sciuto

   OriginalPaper Pages: 139 - 148

6. On the design of random pattern testable PLA based on weighted random pattern testing

   • Dong S. Ha
   • Sudhakar M. Reddy

   OriginalPaper Pages: 149 - 157

7. An implicitly testable boundary scan TAP controller

   • Bernhard Eschermann

   OriginalPaper Pages: 159 - 169

8. Multiple fault detection in two-level multi-output circuits

   • James Jacob
   • Vishwani D. Agrawal

   OriginalPaper Pages: 171 - 173

9. Primitive polynomials of degree 301 through 500

   • Paul H. Bardell

   OriginalPaper Pages: 175 - 176