Volumes and issues

Special Issue on International Conference on VLSI Design and Embedded Systems

Special Issue on Analog, Mixed-Signal and RF Testing

Special Issue on Analog, Mixed-Signal and RF Testing

Special Issue on Analog, Mixed-Signal and RF Testing

Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs

Special Issue on Defect and Fault Tolerance

Special Issue on Defect and Fault Tolerance

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing

Special Issue on Testing of Three-Dimensional Stacked Integrated Circuits

Special Issue on High-Level Design Validation and Test; Guest Editor: Prabhat Mishra

Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi

Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim

Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard

Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi

SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING

Special Issue on On-Line-Testing and Fault Tolerance

On-line Testing

Special Issue on the Third IEEE Latin-American Test Workshop

Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

Special Issue on the Seventh IEEE European Test Workshop