Journal of Electronic Testing

Theory and Applications

ISSN: 0923-8174 (Print) 1573-0727 (Online)

Description

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

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Latest Articles

  1. No Access

    News

    Test Technology Newsletter

    (November 2017)

  2. No Access

    Announcement

    2016 JETTA-TTTC Best Paper Award

    (November 2017)

  3. No Access

    News

    Test Technology Newsletter

    (October 2017)