Journal of Electronic Testing
Theory and Applications
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The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.
A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.
In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.
Vishwani D. Agrawal (August 2019)
Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM
- Journal Title
- Journal of Electronic Testing
- Volume 1 / 1990 - Volume 35 / 2019
- Print ISSN
- Online ISSN
- Springer US
- Additional Links
- Industry Sectors
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