Skip to main content
SpringerLink
Log in

Reliability Physics and Engineering

Time-To-Failure Modeling

  • Textbook
  • © 2013

Overview

Authors:
  1. J. W. McPherson

    1. McPherson Reliability Consulting, LLC, Plano, USA

    View author publications

    You can also search for this author in PubMed   Google Scholar

  • Includes eight new appendices plus three new chapters on screening, heat generation and dissipation, and sampling plans and confidence intervals
  • Provides fundamental reliability physics and engineering tools for building better products
  • Contains statistical training and tools within the text
  • Includes supplementary material: sn.pub/extras

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 79.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 99.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (17 chapters)

  1. Front Matter

    Pages i-xvi
    Download chapter PDF

  2. Introduction

    • J. W. McPherson
    Pages 1-3

  3. Materials and Device Degradation

    • J. W. McPherson
    Pages 5-28

  4. From Material/Device Degradation to Time-to-Failure

    • J. W. McPherson
    Pages 29-36

  5. Time-to-Failure Modeling

    • J. W. McPherson
    Pages 37-49

  6. Gaussian Statistics: An Overview

    • J. W. McPherson
    Pages 51-60

  7. Time-to-Failure Statistics

    • J. W. McPherson
    Pages 61-74

  8. Failure Rate Modeling

    • J. W. McPherson
    Pages 75-89

  9. Accelerated Degradation

    • J. W. McPherson
    Pages 91-103

  10. Acceleration Factor Modeling

    • J. W. McPherson
    Pages 105-115

  11. Ramp-to-Failure Testing

    • J. W. McPherson
    Pages 117-132

  12. Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits

    • J. W. McPherson
    Pages 133-192

  13. Time-to-Failure Models for Selected Failure Mechanisms in Mechanical Engineering

    • J. W. McPherson
    Pages 193-266

  14. Conversion of Dynamical Stresses into Effective Static Values

    • J. W. McPherson
    Pages 267-290

  15. Increasing the Reliability of Device/Product Designs

    • J. W. McPherson
    Pages 291-302

  16. Screening

    • J. W. McPherson
    Pages 303-317

  17. Heat Generation and Dissipation

    • J. W. McPherson
    Pages 319-353

  18. Sampling Plans and Confidence Intervals

    • J. W. McPherson
    Pages 355-376

  19. Back Matter

    Pages 377-399
    Download chapter PDF
Back to top

Keywords

About this book

"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.

Authors and Affiliations

  • McPherson Reliability Consulting, LLC, Plano, USA

    J. W. McPherson

About the author

Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.

Bibliographic Information

Publish with us

Policies and ethics

Back to top

Search

Navigation