Abstract
For a collection of devices, it is critically important to be able to understand the expected failure rate for the devices. For the supplier of such devices, the expected failure rate will be an important indicator of future warranty liability.
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Notes
- 1.
The use of the expression mission critical came into vogue for space applications. In space applications, device repair or replacement is very difficult, if not impossible. Therefore, it is imperative that such devices have extremely low failure rates. However, today, life-support implantable devices are widely used. If one of these devices is part of your life-support system, there is little doubt that you would describe this as a mission-critical application.
- 2.
The identity \( 1 = t/\int_{0}^{t} {{\text{d}}t} \) is used in Eq. (4).
- 3.
In order to be consistent with Eq. (1), the true unit of failure rate λ must be in reciprocal time. Often the pseudo units (failures and devices) are introduced for emphasis and to facilitate a little bookkeeping. However, the true units of the FIT are: 1 FIT = 10−9/h.
- 4.
A common-experience analogy is perhaps useful—the instantaneous speed that you drive is usually far more important than your average speed. Speeding tickets are normally issued based on instantaneous speed, not average speed!
- 5.
This is why the EFR region is also referred to as infant mortality.
Bibliography
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Miller, I. and J. Freund: Probability and Statistics for Engineers, 2 nd . Ed. Prentice-Hall, (1977).
Thomas, T. and P. Lawler: Statistical Methods for Reliability Prediction. In: Electronic Materials Handbook, Vol. 1 Packaging, ASM International, 895 (1989).
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McPherson, J.W. (2013). Failure Rate Modeling. In: Reliability Physics and Engineering. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00122-7_7
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DOI: https://doi.org/10.1007/978-3-319-00122-7_7
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