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Time-to-Failure Statistics

  • J. W. McPherson
Chapter

Abstract

When nearly identically processed materials/devices are placed under the same set of stress conditions, they will not fail exactly at the same time. An explanation for this occurrence is that slight differences can exist in the materials' microstructure, even for materials/devices processed nearly identically.

Keywords

Lognormal Distribution Weibull Distribution Weibull Plot Failure Distribution Cumulative Fraction 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Bibliography

  1. Dhillon, B. and C. Singh: Engineering Reliability, John Wiley & Sons, (1981).Google Scholar
  2. McPherson, J.: Reliability Physics. In: Handbook of Semiconductor Manufacturing Technology, Marcel Dekker, 959 (2000).Google Scholar
  3. Miller, I. and J. Freund: Probability and Statistics for Engineers 2ndEd., Prentice Hall, (1977).Google Scholar
  4. Nelson, W.: Accelerated Testing, John Wiley and Sons, (1990).Google Scholar

Copyright information

© Springer International Publishing Switzerland 2013

Authors and Affiliations

  1. 1.McPherson Reliability Consulting, LLCPlanoUSA

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