Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes A. KrasyukA. OelsnerG. Schönhense Pages: 863 - 868
Determining the spin polarization of surfaces by spin-polarized scanning tunneling spectroscopy A. KubetzkaO. PietzschR. Wiesendanger Pages: 873 - 877
Magnetic force microscopy applied in magnetic data storage technology M.R. KoblischkaB. HewenerG. Persch-Schuy Pages: 879 - 884
Application of SCM for the microcharacterization of semiconductor devices G. ZimmermannA. BornC. Boit Pages: 885 - 888
Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures H.-U. DanzebrinkD.V. KazantsevB. Güttler Pages: 889 - 892
A cryogenic scanning force microscope for the characterization of frozen biological samples J.H. MüllerU.D. SchwarzR. Wiesendanger Pages: 893 - 898
Wetting and scanning force microscopy on rough polymer surfaces: Wenzel’s roughness factor and the thermodynamic contact angle H. KamusewitzW. Possart Pages: 899 - 902
Force-feedback joystick as a low-cost haptic interface for an atomic-force-microscopy nanomanipulator F.J. Rubio-SierraR.W. StarkW.M. Heckl Pages: 903 - 906
Downwards to metrology in nanoscale: determination of the AFM tip shape with well-known sharp-edged calibration structures U. HübnerW. MorgenrothW. Mirandé Pages: 913 - 917
Influence of the oxidation temperature on the fabrication process of silicon dioxide aperture tips A. VollkopfO. RudowE. Oesterschulze Pages: 923 - 926
Pulsed laser deposition and in situ diagnostics of the process applied to shape-memory alloys A. CamposeoF. FusoA. Tuissi Pages: 927 - 934
Flux-enhanced monochromator by ultrasound excitation of annealed Czochralski-grown silicon crystals S. KöhlerR. HockA. Demin Pages: 935 - 938
Structural and electrical properties of Au/Pt/Ti ohmic contacts to degenerated doped n-GaAs J. ZhouG. XiaW. Liu Pages: 939 - 942
High refractive index and transparent heavy metal oxide glassy thin films J. GonzaloO. SanzJ. García López Rapid communication Pages: 943 - 946
Polarisation-sensitive optical coherence tomography for material characterisation and strain-field mapping D. StifterP. BurgholzerC.K. Hitzenberger Rapid communication Pages: 947 - 951
Deposition of large-area, high-quality cubic boron nitride films by ECR-enhanced microwave-plasma CVD W.J. ZhangC.Y. ChanS.T. Lee Rapid communication Pages: 953 - 955
Spiral and curved periodic crack patterns in sol-gel films M. SendovaK. Willis Rapid communication Pages: 957 - 959
Electrical characterization of impurity-free disordering-induced defects in n-GaAs using native oxide layers P.N.K. DeenapanrayH.H. TanC. Jagadish Rapid communication Pages: 961 - 964
Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of ‘mild’ lead telluride film B. LiS. ZhangL. Zeng Rapid communication Pages: 965 - 968
Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films C.H. ChenT. KiguchiN. Mizutani Rapid communication Pages: 969 - 973
Recrystallization behavior of high-dose Mn+-implanted GaAs J. WangZ. LiW. Lu Rapid communication Pages: 975 - 978
Improvement of photoluminescence and electroluminescence characteristics of MBE-grown In0.53Ga0.47As/In0.53(Ga0.6Al0.4)0.47As quantum well laser structure with InGaAlAs digital alloys by thermal annealing J.S. YuJ.D. SongH. Lim Rapid communication Pages: 979 - 982
Femtosecond-laser-induced nanostructure formed on hard thin films of TiN and DLC N. YasumaruK. MiyazakiJ. Kiuchi Rapid communication Pages: 983 - 985
Microstructure evolution in Pr-Co-C-Ti nanophase magnets Y.L. TangD.J. BranaganR.W. McCallum Rapid communication Pages: 987 - 989
Electronic structure of light emitting centers in Er doped Si L.V.C. AssaliF. GanJ.F. Justo Rapid communication Pages: 991 - 997
Micrometer-sized Si-Sn-O novel structures with SiONWs on their surfaces S.H. SunG.W. MengL.D. Zhang Rapid communication Pages: 999 - 1002
Experimental validation of a mass- efficiency model for an indium liquid-metal ion source M. TajmarA. Genovese Rapid communication Pages: 1003 - 1006
