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A miniaturized detector for high-resolution SEMPA

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Abstract.

The basics of the scanning electron microscope with polarization analysis are briefly reviewed, emphasizing the achievable magnetic resolution and image contrast. The design of an optimized spin-polarization detector based on the well-established LEED scattering principle is presented. Results of first tests are reported.

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Authors and Affiliations

  1. IAP, Universität Hamburg, Jungiusstrasse 11, 20355 Hamburg, Germany, , , , , , DE

    R. Frömter & H.P. Oepen

  2. MPI für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany, , , , , , DE

    J. Kirschner

Authors
  1. R. Frömter
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  2. H.P. Oepen
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  3. J. Kirschner
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Additional information

Received: 2 September 2002 / Accepted: 2 September 2002 / Published online: 5 March 2003

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ID="*"Corresponding author. Fax: +49-40/42838-6368, E-mail: RFroemte@PHYSnet.Uni-Hamburg.de

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Frömter, R., Oepen, H. & Kirschner, J. A miniaturized detector for high-resolution SEMPA . Appl Phys A 76, 869–871 (2003). https://doi.org/10.1007/s00339-002-1966-7

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  • DOI: https://doi.org/10.1007/s00339-002-1966-7

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