Abstract.
The characterizations of a so-called ‘mild’ PbTe layer thermal-evaporated from an excess of Te (<1 mol.%) evaporable materials are reported. The results reveal that the film obtained is polycrystalline and has a single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the film has a homogeneous surface morphology and a high degree of homogeneous distribution of Te-rich components along the layer. The study of mid-infrared optical constants of a surface-polished film indicates that the influence of surface scattering on optical properties is very small.
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Received: 3 July 2002 / Accepted: 7 August 2002 / Published online: 4 December 2002
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Li, B., Zhang, S., Zhang, F. et al. Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of ‘mild’ lead telluride film . Appl Phys A 76, 965–968 (2003). https://doi.org/10.1007/s00339-002-1948-9
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DOI: https://doi.org/10.1007/s00339-002-1948-9