Field-enhanced neutralization of electrically active boron in hydrogen implanted Schottky diodes T. ZundelE. CourcelleP. Siffert Contributed Papers 01 June 1986 Pages: 67 - 69
Work function and barrier heights of transition metal silicides E. BucherS. SchulzF. Greuter Contributed Papers 01 June 1986 Pages: 71 - 77
Field-emission flicker noise from potassium adsorbed on W(111) bounded and unbounded surface diffusion by spectral analysis J. BcebenCh. KleintR. Mceclewski Contributed Papers 01 June 1986 Pages: 79 - 84
Analysis of temperature and enhanced diffusion effects in sputtering of CrSi2 A. Miotello Contributed Papers 01 June 1986 Pages: 85 - 89
X-ray photoelectron spectroscopy of boron implanted 4145 steel surface Amarjit SinghE. J. Knystautas Contributed Papers 01 June 1986 Pages: 91 - 93
Annealing study of defects in alpha-irradiated n-type GaAs by positron-annihilation technique A. Sen GuptaS. V. NaiduP. Sen Contributed Papers 01 June 1986 Pages: 95 - 99
Two-dimensional phosphorus diffusion for soft drains in silicon MOS transistors F. LauU. Gösele Contributed Papers 01 June 1986 Pages: 101 - 107
Tantalum and cobalt suicides: Temperature sensor applications R. A. CollinsD. F. C. JohnstonG. Dearnaley Contributed Papers 01 June 1986 Pages: 109 - 117
Anomalous SAW velocity changes on Ti-diffused ZY-LiNbO3 Shu-yi ZhangZhong-nan LuWen-bo Yuan Contributed Papers 01 June 1986 Pages: 119 - 122
Thermal depopulation studies of electron traps in ion implanted silica layers I. StrzałkowskiM. MarczewskiM. Kowalski Contributed Papers 01 June 1986 Pages: 123 - 127
Non-exponential dark capacitance transients from red-emitting GaP LED's — Field and edge effects on the 0.75 eV centre M. ArshedN. BaberN. Zafar Contributed Papers 01 June 1986 Pages: 129 - 132