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Applied Physics A

, Volume 40, Issue 2, pp 123–127 | Cite as

Thermal depopulation studies of electron traps in ion implanted silica layers

  • I. Strzałkowski
  • M. Marczewski
  • M. Kowalski
Contributed Papers

Abstract

The electron trapping sites created by ion implantation through the SiO2 layer are considered. Detailed measurements based on photoinjection and thermodepopulation techniques and computer calculation have been carried out. The density of trapping states versus energy depth appears to have a form of two Gaussian peaks. They are located at 1.17 and 1.30 eV below the SiO2 conduction band having a half width of 0.04 eV.

PACS

73.40.Qv 73.60.Hy 

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Copyright information

© Springer-Verlag 1986

Authors and Affiliations

  • I. Strzałkowski
    • 1
  • M. Marczewski
    • 1
  • M. Kowalski
    • 1
  1. 1.Institute of PhysicsWarsaw Technical UniversityWarsawPoland

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