1. Optical probing of ultrafast devices and integrated circuits

   • Tadao Nagatsuma

   Editorial Pages: 729 - 729

2. Ultrafast electrical signal generation, propagation and detection

   • D. R. Dykaar
   • U. D. Keil

   Invited Papers Pages: 731 - 764

3. Full wave electromagnetic simulation of electrooptic high-speed probes

   • D. Conn
   • H. X. Wu
   • M. Zhang

   Invited Papers Pages: 765 - 782

4. Optoelectronic techniques for ultrafast device network analysis to 700 GHz

   • M. Y. Frankel

   Invited Papers Pages: 783 - 800

5. Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques

   • W. Mertin

   Invited Papers Pages: 801 - 817

6. Scanning probe microscopy for testing ultrafast electronic devices

   • A. S. Hou
   • B. A. Nechay
   • D. M. Bloom

   Invited Papers Pages: 819 - 841

7. Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating

   • J. Nees
   • S. I. Wakana
   • S. Hama

   Invited Papers Pages: 843 - 865

8. Electrooptic characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures

   • A. Zeng
   • M. K. Jackson
   • W. de Raedt

   Papers Pages: 867 - 874

9. Monolithically-integrated optoelectronic circuit for ultrafast sampling of a dual-gate field-effect transistor

   • J. Allam
   • N. de B. Baynes
   • I. Ohbu

   Papers Pages: 875 - 896

10. A new method for characterizing ultrafast resonant-tunnelling diodes with electrooptic sampling

    • N. Shimizu
    • T. Nagatsuma
    • M. Yamamoto

    Papers Pages: 897 - 905

11. Ultrafast characterization of in-plane-gate field-effect transistors: parasitics in laterally gated transistors

    • K. Ogawa
    • J. Allam
    • I. Ohbu

    Papers Pages: 907 - 917

12. Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques

    • G. David
    • D. Jäger
    • I. Wolff

    Papers Pages: 919 - 932

13. Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration

    • A. J. A. Smith
    • A. G. Roddie
    • D. Henderson

    Papers Pages: 933 - 943

14. Electrooptic sampling of freely propagating terahertz fields

    • Q. Wu
    • X. C. Zhang

    Papers Pages: 945 - 951

15. Separating temporally-overlapped waveforms with electrooptic sampling

    • S. A. Shah
    • A. Zeng
    • J. F. Currie

    Papers Pages: 953 - 960

16. Modulation bandwidth and noise limit of photoconductive gates

    • J. R. Hwang
    • H. J. Cheng
    • J. V. Rudd

    Papers Pages: 961 - 973

17. Precise analysis of linear and non-linear chirp parameters of gain-switched distributed feedback laser pulses for the fibre optic compression scheme

    • M. Tsuchiya
    • H. Takeshita
    • T. Kamiya

    Papers Pages: 975 - 982

18. A proposed semiconductor laser pump-probe source

    • A. J. Vickers
    • S. Alleston
    • D. Erasme

    Papers Pages: 983 - 989

19. Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices

    • T. Otsuji
    • T. Nagatsuma
    • M. Yoneyama

    Papers Pages: 991 - 1005