ToF-SIMS and XPS investigations of fibers, coatings and biomedical materials P. J. de LangeJ. W. G. Mahy Lectures Pages: 487 - 493
Interfacial reactions in chromium-carbon multilayers J. SchererK. JungH. Ehrhardt Lectures Pages: 506 - 509
High resolution depth profiling of non-conducting samples with SNMS W. BockM. KopnarskiH. Oechsner Lectures Pages: 510 - 513
“HFM”, the universal sputter method in SNMS analytics D. GrunenbergD. SommerK. H. Koch Lectures Pages: 514 - 520
Induced zinc desorption from zinc oxide during exposure to a reducing agent Ch. KrummelA. FreilingC. D. Kohl Lectures Pages: 521 - 523
3D-SIMS analysis of ultra high purity molybdenum and tungsten: a characterisation of different manufacturing techniques and products Peter WilhartitzR. KrismerH. M. Ortner Lectures Pages: 524 - 532
Determination of diffusion induced concentration profiles in Cr2O3 films on ceramic Al2O3 by Auger sputter depth profiling U. RothhaarH. Oechsner Lectures Pages: 533 - 535
RFA as control method of the reactive sputtering process of TiN films T. StobieckiF. StobieckiG. Berg Lectures Pages: 536 - 540
Surface analysis on industrial surfaces — now comparable D. SommerH. P. Dickhoven Lectures Pages: 541 - 543
AES investigations of the hot cracking of an electron-beam welded nickel-base alloy for turbine disks V. SchlettW.-B. Busch Lectures Pages: 544 - 547
Accuracy of the elemental quantification with plasma-based SNMS for complex environmental material J. GoschnickM. SommerH. J. Ache Lectures Pages: 548 - 551
Characterization of surface modifications of stainless steel samples after electron and ion bombardment by SEM, AES, and XPS B. GarkeM. EhrtC. Edelmann Lectures Pages: 552 - 555
Modelling the dielectric function of thin films measured by spectroscopic ellipsometry: determination of microstructure and density T. HaageU. I. SchmidtH. Oechsner Lectures Pages: 556 - 558
Depth-resolved investigation of the element and compound inventory of aerosol particles from outdoor air J. W. G. BentzJ. GoschnickH. J. Ache Lectures Pages: 559 - 564
MCs+ secondary ion and sputtering yields of oxygen-exposed semiconductors and glasses M. HaagH. GnaserH. Oechsner Lectures Pages: 565 - 569
Radio-frequency glow discharge ion source for high resolution mass spectrometry A. I. SaprykinF.-G. MelchersH.-J. Dietze Poster Sessions Pages: 570 - 574
Surface analysis using ultrashort laser pulses and time-of-flight mass spectrometry M. SchützeC. TrappeH. Kurz Poster Sessions Pages: 575 - 577
Simultaneous analysis of low-Z impurities in the near-surface region of solid materials by heavy ion elastic recoil detection (HIERD) S. GrigullR. BehrischM. Harz Poster Sessions Pages: 578 - 581
Quantitative elastic recoil detection (ERD) A. BergmaierG. DollingerT. Faestermann Poster Sessions Pages: 582 - 584
Analytical techniques with a nuclear microprobe J. AdamczewskiH. RöckenF. Bruhn Poster Sessions Pages: 585 - 588
Investigation of high-temperature-oxidation of metals by infrared-reflection-absorption spectroscopy (IRAS) T. ScherüblL. K. Thomas Poster Sessions Pages: 589 - 593
A concept of a scanning positron microscope K. UhlmannW. TriftshäuserG. Karwasz Poster Sessions Pages: 594 - 597
Rapid determination of erosion rates with electron beam SNMS J. GoschnickM. FichtnerH. J. Ache Poster Sessions Pages: 598 - 602
Analysis and classification of individual outdoor aerosol particles with SIMS time-of-flight mass spectrometry J. W. G. BentzJ. GoschnickA. Benninghoven Poster Sessions Pages: 603 - 608
A multisource image processing environment in surface analysis S. D. BöhmigK. W. BrandlH. Störi Poster Sessions Pages: 609 - 613
Surface analysis of sol-gel coatings on glass by secondary neutral mass spectrometry R. AmbosE. RädleinG. H. Frischat Poster Sessions Pages: 614 - 618
Optimization of large area pulsed laser deposition of YBaCuO thin films by SNMS depth profiling and rutherford backscattering H. BörnerH. HochmuthM. Lorenz Poster Sessions Pages: 619 - 624
Interface studies on magnetron-sputtered SnO2-films H.-J. MichelH. LeisteJ. Halbritter Poster Sessions Pages: 625 - 630
Application of an improved thermodynamic description of multilayer surface compositions of binary alloys W. HoferL. Z. Mezey Poster Sessions Pages: 631 - 633
Investigation on structure and morphology of the thermally treated glassy alloy (Fe,Cr)80(P,C,Si)20 by means of ESCA and SEM/EDXA A. LippitzK. ForkelR. Stodolski Poster Sessions Pages: 634 - 638
Comparative composition analysis of SiOx and SiNx thin films by AES, EDX and RBS I. SieberA. SchöpkeB. Selle Poster Sessions Pages: 639 - 641
Characterization of polymeric light emitting diodes by SIMS depth profiling analysis G. SauerM. KiloD. Haarer Poster Sessions Pages: 642 - 646
Ex-situ XPS-investigation of the interface between PE-CVD SiO2 and wet chemically etched MO-CVD epitaxial layers of In0.53Ga0.47As M. ProcopK. WandelR. Verucchi Poster Sessions Pages: 647 - 654
Influence of different correction models on investigations of carbonaceous insulating films by electron beam X-ray microanalysis W. BaumannK. WeiseG. Marx Poster Sessions Pages: 655 - 656
Adsorption and characterization of molecular adhesion promoter monolayers on iron surfaces under UHV conditions C. ReinartzW. FürbethM. Stratmann Poster Sessions Pages: 657 - 660
Interaction of water with clean and oxygen precovered nickel surfaces M. SchulzeR. ReißnerW. Kuch Poster Sessions Pages: 661 - 665
Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy I. SchmitzT. ProhaskaM. Grasserbauer Poster Sessions Pages: 666 - 669
In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy T. ProhaskaG. FriedbacherW. Schlapp Poster Sessions Pages: 670 - 674
Scanning Auger analysis for the clarification of oxidation and interdiffusion processes during laser ablation of YBa2Cu3O7-x on alloy/oxide substrates M. R. MaierH. ViefhausH. J. Grabke Poster Sessions Pages: 675 - 677
Influence of N, C and S on the initial stage of oxidation of Fe-20Cr single crystals R. DennertH. J. GrabkeH. Viefhaus Poster Sessions Pages: 678 - 683
SAM/AES analysis of grain boundaries in zirconia ceramics E. M. MoserM. MetzgerL. J. Gauckler Poster Sessions Pages: 684 - 689
Investigation of surface topography, morphology and structure of amorphous carbon films by AFM and TEM H.-J. ScheibeD. DrescherA. Mensch Poster Sessions Pages: 690 - 694
Raman characterization of amorphous carbon films H.-J. ScheibeD. DrescherP. Alers Poster Sessions Pages: 695 - 697
AFM investigation of silicon substrates for chemical vapour deposition of diamond films G. M. FuchsG. FriedbacherB. Lux Poster Sessions Pages: 698 - 701
Investigations on microstructure, composition and properties of PECVD TiNx-coatings J. KlosowskiI. EndlerD. Schläfer Poster Sessions Pages: 702 - 706
Characterization of thin alumina films prepared by metal-organic chemical vapour deposition (MOCVD) by high resolution SEM, (AR)XPS and AES depth profiling W. LisowskiA. H. J. van den BergV. A. C. Haanappel Poster Sessions Pages: 707 - 712
Analysis of the morphology and the optical properties of sputtered molybdenum particles R. JoergerK. ForchtU. Weimar Poster Sessions Pages: 713 - 717
Surface morphology and electrical properties of copper thin films prepared by MOCVD M. BechtK.-H. DahmenA. Baiker Poster Sessions Pages: 718 - 722