Out of Iowa: Students learn more than materials engineering in Mali Lynne Robinson Feature 24 December 2010 Pages: 11 - 14
Small-scale materials behavior from X-ray microdiffraction and imaging Rozaliya I. BarabashGene E. Ice Advanced Materials Analysis 24 December 2010 Pages: 21 - 21
Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques W. LudwigA. KingJ. Y. Buffière Advanced Materials Analysis 24 December 2010 Pages: 22 - 28
Measuring depth-dependent dislocation densities and Elastic strains in an indented Ni-based Superalloy O. M. BarabashM. SantellaJ. Tischler Advanced Materials Analysis 24 December 2010 Pages: 29 - 34
The use of Laue microdiffraction to study small-scale plasticity H. Van SwygenhovenS. Van Petegem Advanced Materials Analysis 24 December 2010 Pages: 36 - 43
Rrevealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD Ralph D. NyilasStephan FrankRalph Spolenak Advanced Materials Analysis 24 December 2010 Pages: 44 - 51
Solid State interfaces: Toward an atomistic-scale understanding of structure, properties, and behavior D. L. MedlinM. J. DemkowiczE. A. Marquis Solid State Interfaces 24 December 2010 Pages: 52 - 52
Atomic-scale STEM-EELS mapping across functional interfaces Christian ColliexLaura BocherMichael Walls Research Summary 24 December 2010 Pages: 53 - 57
Nanoanalysis of interfacial chemistry G. SchmitzC. EneP. Stender Overview 24 December 2010 Pages: 58 - 63
The use of advanced characterization to study transitions across solid state interfaces R. SrinivasanR. BanerjeeH. L. Fraser Overview 24 December 2010 Pages: 64 - 69
Behavior of dopant-modified interfaces in metallic nanocrystalline materials Rahul K. RajgarhiaDouglas E. SpearotAshok Saxena Overview 24 December 2010 Pages: 70 - 74
Interface-enabled defect reduction in He ion irradiated metallic multilayers X. ZhangE. G. FuM. J. Demkowicz Research Summary 24 December 2010 Pages: 75 - 78
The characterization of new and next-generation materials Mingdong CaiJiann-Yang Hwang Commentary 24 December 2010 Pages: 79 - 79
Physical, chemical and antimicrobial characterization of copper-bearing material Bowen LiJiann-Yang HwangSusan Bagley Research Summary 24 December 2010 Pages: 80 - 85
Characterization and analysis of Porous, Brittle solid structures by X-ray micro computed tomography C. L. LinA. R. VidelaJ. D. Miller Research Summary 24 December 2010 Pages: 86 - 89
Materials applications of photoelectron emission microscopy G. XiongR. ShaoW. D. Wei Overview 24 December 2010 Pages: 90 - 93
Solar-grade silicon production by metallothermic reduction Kouji YasudaToru H. Okabe Overview 24 December 2010 Pages: 94 - 101
Characterization of copper nanoparticles synthesized by a novel microbiological method Ratnika VarshneySeema BhadauriaRenu Pasricha Characterization of Next-Generation Materials 24 December 2010 Pages: 102 - 104
Get involved: Megan Frary, material advantage advisor Kelly Zappas Also in this Issue 24 December 2010 Pages: 110 - 110