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Atomic-scale STEM-EELS mapping across functional interfaces

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  • Solid State Interfaces
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Abstract

Aberration-corrected scanning transmission electron microscopes can now raster Angström-sized electron probes across cross-sectional foils with interfaces parallel to the incident beam. Bright and annular dark field images deliver views of the structural arrangement of the atomic columns across such interfaces. In parallel, electron energy-loss spectroscopy is efficient for recording the electronic response of the specimen with a high level of spatial and energy resolution. It thus provides maps, atomic column by atomic column, of the nature, and in some cases of the bonding state, of the atoms across artificially grown heterolayers for electronics, spintronics, and photonics components.

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Authors and Affiliations

  1. Laboratoire de Physique des Solides (UMR CNRS 8502), Université Paris Sud XI, Bâtiment 510, 91405, Orsay, France

    Christian Colliex, Laura Bocher, Francisco de la Peňa, Alexandre Gloter, Katia March & Michael Walls

Authors
  1. Christian Colliex
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  2. Laura Bocher
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  3. Francisco de la Peňa
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  4. Alexandre Gloter
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  5. Katia March
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  6. Michael Walls
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Correspondence to Christian Colliex.

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Colliex, C., Bocher, L., de la Peňa, F. et al. Atomic-scale STEM-EELS mapping across functional interfaces. JOM 62, 53–57 (2010). https://doi.org/10.1007/s11837-010-0181-9

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  • DOI: https://doi.org/10.1007/s11837-010-0181-9

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