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Nanoanalysis of interfacial chemistry

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Abstract

In recent years, atom probe tomography has advanced to an outstanding tool of analyzing interfacial chemistry in nanostructured materials. In this article, quantitative measurements of the natural width of multilayer interfaces and of segregation at grain boundaries and even at separate triple junctions of the boundary structure are presented and their physical consequences discussed.

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Authors and Affiliations

  1. Institute of Material Physics, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Str. 10, 48149, Münster, Germany

    G. Schmitz, C. Ene, H. Galinski, R. Schlesiger & P. Stender

Authors
  1. G. Schmitz
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  2. C. Ene
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  3. H. Galinski
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  4. R. Schlesiger
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  5. P. Stender
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Correspondence to G. Schmitz.

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Schmitz, G., Ene, C., Galinski, H. et al. Nanoanalysis of interfacial chemistry. JOM 62, 58–63 (2010). https://doi.org/10.1007/s11837-010-0182-8

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