1. Structure of Ba_0.7Sr_0.3TiO₃ films grown by chemical solution deposition on polycor substrates

   • O. M. Zhigalina
   • K. A. Vorotilov
   • A. S. Sigov

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 677 - 682

2. Atomic force microscopy of the mirror cleavage surface of defect TGS crystals

   • N. V. Belugina
   • R. V. Gainutdinov
   • A. L. Tolstikhina

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 683 - 687

3. EBIC investigations of GaN layers prepared by epitaxial lateral overgrowth

   • P. S. Vergeles
   • A. V. Govorkov
   • E. B. Yakimov

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 688 - 691

4. Atomic force microscopy study of ferroelectric films of P(VDF-TrFE) copolymer and composites based on it

   • A. V. Solnyshkin
   • D. A. Kiselev
   • R. Gerhard

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 692 - 695

5. Study of high-porous silica surface by atomic force microscopy re]20071018

   • S. N. Kokorin
   • E. A. Sosnov
   • A. A. Malygin

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 696 - 698

6. Features of sample preparation and atomic force microscopy study of dispersed nanomaterials

   • E. A. Sosnov
   • A. A. Malygin

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 699 - 704

7. Epitaxial growth of CeO₂ on silicon and distribution of element concentration at the interface

   • V. G. Beshenkov
   • A. G. Znamenskii
   • V. A. Marchenko

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 705 - 708

8. On the choice of initial approximation in the problem of parameter identification of direct-gap semiconductors by cathodoluminescence microscopy

   • Yu. E. Gagarin
   • N. N. Mikheev
   • M. A. Stepovich

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 709 - 715

9. Structure, properties, and formation models of optical ceramics

   • M. Sh. Akchurin
   • R. V. Gainutdinov
   • A. A. Kaminskii

   XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 716 - 721

10. Features in atomic force microscopy studies of dielectric surfaces

    • A. L. Tolstikhina
    • R. V. Gainutdinov
    • Yu. V. Grishchenko

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 722 - 726

11. Effect of sample contamination in SEMs on linear size measurements

    • Yu. V. Larionov
    • V. B. Mityukhlyaev
    • M. N. Filippov

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 727 - 737

12. Influence of a lubricant modified with fine-dispersed β-sialon on a steel surface structure under friction loading

    • E. N. Volnyanko
    • S. F. Ermakov
    • V. A. Smurugov

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 738 - 743

13. Analysis of the adhesion strength of the composite coating based on a sodium carboxymethylcellulose polymer matrix with a fine-dispersed aluminum filler

    • N. M. Antonova
    • V. I. Kulinich

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 744 - 747

14. Comparison of autoemission properties of tungsten/n-and p-type semiconductor systems

    • N. V. Egorov
    • L. I. Antonova
    • S. P. Antonov

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 748 - 750

15. Effect of partial recovery of zinc surface at room temperature after basal plane indentation

    • P. V. Kuznetsov
    • I. V. Petrakova
    • N. P. Beketov

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 751 - 758

16. Mineral nanoparticles in dispersed soils

    • V. N. Sokolov
    • M. S. Chernov
    • V. V. Krupskaya

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (Rem-2007) 12 October 2008 Pages: 759 - 763

17. Quantum size effect during the electron exchange between a negative hydrogen ion and a cluster of aluminum atoms

    • A. A. Magunov
    • D. K. Shestakov
    • I. F. Urazgil’din

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (Rem-2007) 12 October 2008 Pages: 764 - 767

18. Theoretical permittivity spectra of isoelectronic Ge, GaAs, ZnSe, and CuBr crystals

    • A. I. Kalugin
    • V. V. Sobolev

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (Rem-2007) 12 October 2008 Pages: 768 - 771

19. Spectra of the complete set of CdBr₂ optical functions in a broad energy range of 3 to 30 eV

    • E. V. Baranova
    • A. I. Kalugin
    • V. Val. Sobolev

    XV Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (REM-2007) 12 October 2008 Pages: 772 - 776

20. Fine structure of the diffraction image of an edge dislocation in high-resolution section topography

    • E. V. Suvorov
    • I. A. Smirnova

    OriginalPaper 12 October 2008 Pages: 777 - 782

21. Infrared spectroscopic characterization of the properties of oxide films grown on Zr surfaces doped under ion-beam irradiation in a vapor-water medium

    • B. A. Kalin
    • N. V. Volkov
    • I. V. Oleinikov

    OriginalPaper 12 October 2008 Pages: 783 - 786

22. Plasmon model for excitation of secondary atoms in ion sputtering (comparison with electron-exchange models)

    • N. N. Nikitenkov

    OriginalPaper 12 October 2008 Pages: 787 - 789

23. Al/Nb interface study based on the analysis of the energy spectra of reflected electrons

    • V. P. Afanas’ev
    • A. V. Lubenchenko
    • A. B. Pavolotskii

    OriginalPaper 12 October 2008 Pages: 790 - 795

24. Grazing incidence off-plane lamellar grating as a beam splitter for a 1-Å free electron laser

    • L. I. Goray

    OriginalPaper 12 October 2008 Pages: 796 - 800

25. Spectra of characteristic losses and the electronic structure of sodium nitrite

    • A. I. Kalugin
    • V. V. Sobolev
    • V. Val. Sobolev

    OriginalPaper 12 October 2008 Pages: 801 - 805

26. Synchrotron reflectivity spectrum, characteristic electron losses, and electronic structure of TlCl crystals

    • V. V. Sobolev
    • A. I. Kalugin
    • V. Val. Sobolev

    OriginalPaper 12 October 2008 Pages: 806 - 810

27. Influence of low-energy ion treatment on the roughness of glassceramic, alumina, and quartz substrates

    • V. M. Vetoshkin
    • P. N. Krylov

    OriginalPaper 12 October 2008 Pages: 811 - 813

28. Electrolytes in etching of latent tracks of heavy ions in polyethylene terephthalate

    • A. I. Vilensky
    • Yu. K. Kochnev
    • B. V. Mchedlishvili

    OriginalPaper 12 October 2008 Pages: 814 - 816

29. Svetlana Ivanovna Zheludeva (1948–2008)

    Obituary 12 October 2008 Pages: 817 - 818